LM2696
www.ti.com
SNVS375B –OCTOBER 2005–REVISED APRIL 2013
LM2696 3A, Constant On Time Buck Regulator
Check for Samples: LM2696
1
FEATURES
DESCRIPTION
The LM2696 is a pulse width modulation (PWM) buck
regulator capable of delivering up to 3A into a load.
The control loop utilizes a constant on-time control
scheme with input voltage feed forward. This provides
a topology that has excellent transient response
without the need for compensation. The input voltage
feed forward ensures that a constant switching
frequency is maintained across the entire VIN range.
2
•
•
•
•
•
•
•
•
•
Input Voltage Range of 4.5V–24V
Constant On-Time
No Compensation Needed
Maximum Load Current of 3A
Switching Frequency of 100 kHz–500 kHz
Constant Frequency Across Input Range
TTL Compatible Shutdown Thresholds
Low Standby Current of 12 µA
130 mΩ Internal MOSFET Switch
The LM2696 is capable of switching frequencies in
the range of 100 kHz to 500 kHz. Combined with an
integrated 130 mΩ high side NMOS switch the
LM2696 can utilize small sized external components
and provide high efficiency. An internal soft-start and
power-good flag are also provided to allow for simple
sequencing between multiple regulators.
APPLICATIONS
•
High Efficiency Step-Down Switching
Regulators
The LM2696 is available with an adjustable output in
an exposed pad HTSSOP-16 package.
•
•
LCD Monitors
Set-Top Boxes
Typical Application Circuit
LM2696
V
EXTV
PGOOD
PGOOD
CC
C
EXT
V
SD
SD
C
SD
RON
AVIN
CBOOT
R
ON
C
C
BOOT
L
V
IN
SW
V
OUT
PVIN
SS
R
R
FB1
GND
D
SS
CATCH
C
AVIN
C
FB
IN
C
OUT
FB2
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated