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LM119J-SMD PDF预览

LM119J-SMD

更新时间: 2024-11-05 11:33:39
品牌 Logo 应用领域
美国国家半导体 - NSC 比较器放大器放大器电路
页数 文件大小 规格书
18页 356K
描述
HIGH SPEED DUAL COMPARATOR

LM119J-SMD 技术参数

是否Rohs认证: 不符合生命周期:Transferred
零件包装代码:DIP包装说明:CERDIP-14
针数:14Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:5.07Is Samacsys:N
放大器类型:COMPARATOR最大平均偏置电流 (IIB):0.475 µA
25C 时的最大偏置电流 (IIB):0.475 µA最大输入失调电压:3800 µV
JESD-30 代码:R-GDIP-T14JESD-609代码:e0
长度:19.43 mm湿度敏感等级:1
负供电电压上限:-18 V标称负供电电压 (Vsup):-15 V
功能数量:2端子数量:14
最高工作温度:125 °C最低工作温度:-55 °C
输出类型:OPEN-COLLECTOR封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP14,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):260电源:+-15 V
认证状态:Not Qualified标称响应时间:80 ns
筛选级别:38535Q/M;38534H;883B座面最大高度:5.08 mm
子类别:Comparator供电电压上限:18 V
标称供电电压 (Vsup):15 V表面贴装:NO
技术:BIPOLAR温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:40宽度:7.62 mm
Base Number Matches:1

LM119J-SMD 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/02/01  
Last Update Date: 07/11/01  
Last Major Revision Date:  
MDLM119-X REV 2A2  
HIGH SPEED DUAL COMPARATOR  
General Description  
The LM119 precision high speed dual comparator is fabricated on a single monolithic chip.  
It is designed to operate over a wide range of supply voltages down to a single 5V logic  
supply and ground. Furthermore, it has a higher gain and lower input current than other  
devices. The uncommitted collector of the output stage makes the LM119 compatible with  
RTL, DTL and TTL as well as capable of driving lamps and relays at currents up to 25mA.  
Industry Part Number  
NS Part Numbers  
LM119  
LM119E-SMD  
LM119H-QMLV  
LM119H-SMD  
LM119J-QMLV  
LM119J-SMD  
LM119W-QMLV  
LM119W-SMD  
LM119WG-QMLV  
LM119WG-SMD  
Prime Die  
LM119  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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