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IS61QDPB451236A-400M3LI PDF预览

IS61QDPB451236A-400M3LI

更新时间: 2024-02-08 15:19:21
品牌 Logo 应用领域
美国芯成 - ISSI 时钟静态存储器内存集成电路
页数 文件大小 规格书
33页 653K
描述
QDR SRAM, 512KX36, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LEAD FREE, LFBGA-165

IS61QDPB451236A-400M3LI 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:LBGA, BGA165,11X15,40Reach Compliance Code:compliant
Factory Lead Time:10 weeks风险等级:5.16
最长访问时间:0.45 ns最大时钟频率 (fCLK):400 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
长度:17 mm内存密度:18874368 bit
内存集成电路类型:QDR SRAM内存宽度:36
功能数量:1端子数量:165
字数:524288 words字数代码:512000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:512KX36
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.32 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:1 mA
最大供电电压 (Vsup):1.89 V最小供电电压 (Vsup):1.71 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM宽度:15 mm
Base Number Matches:1

IS61QDPB451236A-400M3LI 数据手册

 浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第2页浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第3页浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第4页浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第5页浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第6页浏览型号IS61QDPB451236A-400M3LI的Datasheet PDF文件第7页 
IS61QDPB41M18A/A1/A2  
IS61QDPB451236A/A1/A2  
1Mx18, 512Kx36  
18Mb QUADP (Burst 4) SYNCHRONOUS SRAM  
JANUARY 2013  
(2.5 Cycle Read Latency)  
FEATURES  
DESCRIPTION  
The 18Mb IS61QDPB451236A/A1/A2 and  
512Kx36 and 1Mx18 configuration available.  
IS61QDPB41M18A/A1/A2 are synchronous, high-  
performance CMOS static random access memory (SRAM)  
devices. These SRAMs have separate I/Os, eliminating the  
need for high-speed bus turnaround. The rising edge of K  
clock initiates the read/write operation, and all internal  
operations are self-timed. Refer to the Timing Reference  
Diagram for Truth Table for a description of the basic  
operations of these QUADP (Burst of 4) SRAMs. Read and  
write addresses are registered on alternating rising edges of  
the K clock. Reads and writes are performed in double data  
rate.  
On-chip Delay-Locked Loop (DLL) for wide data  
valid window.  
Separate independent read and write ports with  
concurrent read and write operations.  
Synchronous pipeline read with late write operation.  
Double Data Rate (DDR) interface for read and  
write input ports.  
2.5 cycle read latency.  
Fixed 4-bit burst for read and write operations.  
Clock stop support.  
The following are registered internally on the rising edge of  
the K clock:  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
Read/write address  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
Read enable  
Data Valid Pin (QVLD).  
Write enable  
Byte writes for burst addresses 1 and 3  
Data-in for burst addresses 1 and 3  
+1.8V core power supply and 1.5, 1.8V VDDQ, used  
with 0.75, 0.9V VREF.  
HSTL input and output interface.  
The following are registered on the rising edge of the K#  
clock:  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
Byte writes for burst addresses 2 and 4  
Full data coherency.  
Data-in for burst addresses 2 and 4  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered one cycle after  
the write address. The first data-in burst is clocked one cycle  
later than the write command signal, and the second burst is  
timed to the following rising edge of the K# clock. Two full  
clock cycles are required to complete a write operation.  
Byte write capability.  
Fine ball grid array (FBGA) package:  
13mmx15mm and 15mmx17mm body size  
165-ball (11 x 15) array  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
During the burst read operation, the data-outs from the first  
and third bursts are updated from output registers of the third  
and fourth rising edges of the K# clock (starting 2.5 cycles  
later after read command). The data-outs from the second  
and fourth bursts are updated with the fourth and fifth rising  
edges of the K clock where the read command receives at  
the first rising edge of K. Two full clock cycles are required to  
complete a read operation.  
ODT (On Die Termination) feature is supported  
optionally on data input, K/K#, and BWx#.  
The end of top mark (A/A1/A2) is to define options.  
IS61QDPB451236A : Don’t care ODT function  
and pin connection  
IS61QDPB451236A 1 : Option1  
IS61QDPB451236A 2 : Option2  
Refer to more detail description at page 6 for each  
ODT option.  
The device is operated with a single +1.8V power supply  
and is compatible with HSTL I/O interfaces.  
Copyright © 2012 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. A  
1
1/2/2013  

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