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IC42S16102-5BG PDF预览

IC42S16102-5BG

更新时间: 2024-02-22 09:51:02
品牌 Logo 应用领域
矽成 - ICSI 内存集成电路动态存储器时钟
页数 文件大小 规格书
78页 764K
描述
512K x 16 Bit x 2 Banks (16-MBIT) SDRAM

IC42S16102-5BG 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:SOP, TSOP50,.46,32Reach Compliance Code:compliant
风险等级:5.75访问模式:DUAL BANK PAGE BURST
最长访问时间:4.5 ns其他特性:AUTO/SELF REFRESH
最大时钟频率 (fCLK):200 MHzI/O 类型:COMMON
交错的突发长度:1,2,4,8JESD-30 代码:R-PDSO-G50
JESD-609代码:e3内存密度:16777216 bit
内存集成电路类型:SYNCHRONOUS DRAM内存宽度:16
功能数量:1端口数量:1
端子数量:50字数:1048576 words
字数代码:1000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:1MX16输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装等效代码:TSOP50,.46,32封装形状:RECTANGULAR
封装形式:SMALL OUTLINE电源:3.3 V
认证状态:Not Qualified刷新周期:4096
自我刷新:YES连续突发长度:1,2,4,8,FP
最大待机电流:0.002 A子类别:DRAMs
最大压摆率:0.15 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Matte Tin (Sn) - annealed
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUALBase Number Matches:1

IC42S16102-5BG 数据手册

 浏览型号IC42S16102-5BG的Datasheet PDF文件第4页浏览型号IC42S16102-5BG的Datasheet PDF文件第5页浏览型号IC42S16102-5BG的Datasheet PDF文件第6页浏览型号IC42S16102-5BG的Datasheet PDF文件第8页浏览型号IC42S16102-5BG的Datasheet PDF文件第9页浏览型号IC42S16102-5BG的Datasheet PDF文件第10页 
IC42S16102  
AC CHARACTERISTICS(1,2,3)  
-5  
-6  
-7  
Symbol Parameter  
Min. Max.  
Min. Max.  
Min.  
Max Units  
tCK3  
tCK2  
Clock Cycle Time  
CAS Latency = 3  
CAS Latency = 2  
5
6
7
ns  
7
8
8.6  
ns  
tAC3  
Access Time From CLK(4)  
CAS Latency = 3  
2
2
2
0
4.5  
5
2
2
2
0
5.5  
6
6
6
ns  
ns  
ns  
ns  
ns  
ns  
tAC2  
CAS Latency = 2  
tCHI  
tCL  
tOH  
tLZ  
CLK HIGH Level Width  
CLK LOW Level Width  
Output Data Hold Time  
2.5  
2.5  
2
Output LOW Impedance Time  
0
tHZ3  
Output HIGH Impedance Time(5)  
CAS Latency = 3  
CAS Latency = 2  
4.5  
5.5  
6
ns  
tHZ2  
5
6
6
ns  
tDS  
tDH  
tAS  
tAH  
tCKS  
tCKH  
tCKA  
tCS  
tCH  
tRC  
tRAS  
tRP  
tRCD  
tRRD  
tDPL  
Input Data Setup Time  
Input Data Hold Time  
Address Setup Time  
Address Hold Time  
CKE Setup Time  
CKE Hold Time  
2
1
2
1
2
1
2
1
2
1
2
1
2
1
2
1
2
1
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CKE to CLK Recovery Delay Time  
1CLK+3  
1CLK+3  
1CLK+3  
Command Setup Time (CS, RAS, CAS, WE, DQM)  
Command Hold Time (CS, RAS, CAS, WE, DQM)  
Command Period (REF to REF / ACT to ACT)  
Command Period (ACT to PRE)  
Command Period (PRE to ACT)  
Active Command To Read / Write Command Delay Time  
Command Period (ACT [0] to ACT[1])  
2
1
50  
2
1
60  
2
1
70  
30 100,000  
15  
15  
10  
2CLK  
36 100,000  
18  
18  
12  
2CLK  
42 100,000 ns  
21  
21  
14  
2CLK  
ns  
ns  
ns  
ns  
Input Data To Precharge  
Command Delay time  
tDAL  
Input Data To Active / Refresh  
2CLK+tRP  
2CLK+tRP  
2CLK+tRP  
ns  
Command Delay time (During Auto-Precharge)  
tTTransition Time  
1
10  
64  
1
10  
64  
1
10  
64  
ns  
ms  
tREF  
Refresh Cycle Time (4096)  
Notes:  
1. When power is first applied, memory operation should be started 100 µs after Vcc and VccQ reach their stipulated  
voltages. Also note that the power-on sequence must be executed before starting memory operation.  
2. Measured with tT = 1 ns.  
3. The reference level is 1.4 V when measuring input signal timing. Rise and fall times are measured between VIH (min.) and  
VIL (max.).  
4. Access time is measured at 1.4V with the load shown in the figure below.  
5. The time tHZ (max.) is defined as the time required for the output voltage to transition by ± 200 mV from VOH (min.) or VOL  
(max.) when the output is in the high impedance state.  
Integrated Circuit Solution Inc.  
7
DR042-0A 01/18/2005  

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