HVV1214-025
L-Band Radar Pulsed Power Transistor
1200-1400 MHz, 200µs Pulse, 10% Duty
DESCRIPTION
PACKAGE
The high power HVV1214-25 device is a high
voltage silicon enhancement mode RF transistor
designed for L-Band pulsed radar applications
operating over the frequency range from
1.2 GHz to 1.4 GHz.
FEATURES
•
•
•
High Power Gain
Excellent Ruggedness
48V Supply Voltage
The device resides in a Surface Mount
Transistor Package with a ceramic lid. The
SMT package style is qualified for gross leak
test – MIL-STD-750D, Method 1071.6, Test
Condition C.
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter
Value
Unit
V
V
A
W
°C
RUGGEDNESS
VDSS
VGS
Drain-Source Voltage 105
Gate-Source Voltage
Drain Current
10
2
116
IDSX
The HVV1214-25 device is capable of
withstanding an output load mismatch
corresponding to a 20:1 VSWR over all phase
angles and rated output power and operating
voltage across the frequency band of
operation.
2
PD
Power Dissipation
TS
Storage Temperature -65 to
+200
TJ
Junction
Temperature
200
°C
Symbol Parameter
Test Condition
POUT = 25W
Max
20:1
Units
VSWR
LMT1
Load
THERMAL CHARACTERISTICS
Mismatch
Tolerance
F = 1400 MHz
Symbol Parameter
Max
1.5
Unit
°C/W
1
θJC
Thermal Resistance
ELECTRICAL CHARACTERISTICS
Symbol
VBR(DSS)
IDSS
Parameter
Conditions
Typ
110
<10
<1
17.5
8
Units
V
Drain-Source Breakdown
Drain Leakage Current
Gate Leakage Current
Power Gain
Input Return Loss
Drain Efficiency
VGS=0V,ID=1mA
VGS=0V,VDS=48V
VGS=5V,VDS=0V
POUT=25W,F=1200,1400MHz
POUT=25W,F=1200,1400MHz
POUT=25W,F=1200,1400MHz
POUT=25W,F=1200,1400MHz
µA
µA
dB
dB
%
IGSS
GP1
IRL1
1
ηD
49
<0.2
PD1
Pulse Droop
dB
1.) Under Pulse Conditions: Pulse Width = 200 µsec, Pulse Duty Cycle = 10% at VDD = 48V, IDQ = 15mA
2.) Rated at TCASE = 25°C
HVVi Semiconductors, Inc.
10235 S. 51st St. Suite 100
Phoenix, Az. 85044
For additional information, visit: www.hvvi.com
HVVi Semiconductors, Inc. Confidential
© 2008 HVVi Semiconductors, Inc. All Rights Reserved.
April 23 2008
1