Datasheet > HSMS-280X/1X/2X

HSMS-280X/1X/2X

更新时间： 2024-11-07 23:56:43

品牌	Logo	应用领域
其他 - ETC		肖特基二极管光电二极管
页数	文件大小	规格书
4页	31K
描述
Surface Mount Schottky Diodes -- Reliability Data (28K in pdf)

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HSMS-280X/1X/2X 数据手册

Surface Mount Schottky Diodes

Reliability Data

HSMS-280X/1X/2X

HSMS-280A/1A/2A

The following cumulative test

results have been obtained from

testing performed at Hewlett-

Packard Communications Com-

ponents Division in accordance

with the latest revision of

from the product qualification,

reliability monitor, and

engineering evaluation.

and/or mechanical specification

listed in the Hewlett-Packard

Communications Components

Designer’s Catalog.

For the purpose of this reliability

data sheet, a failure is any part

which fails to meet the electrical

MIL-STD-750. Data was gathered

1. Life Test

A. Demonstrated Performance

Units

Tested

Total

Device Hrs.

Total

Failed

Failure Rate

1%/1K Hrs.

Test

Test Conditions

High Temp. Rev.

Bias (HTRB)

V = 80% V_BR, T_A= 150°C

804

1,068

250

828,045

Operating Life

(O.L.)

T_A= 25°C, P_FM= 250 mW

999,884

251,900

V = 80% V , 60 Hz

High Temp.

Operating

10 mA DC, T_A= 150°C

Life (HTOL)

High Temp.

T_A= 150°C

2,917

1,836,660

Storage (HTS)

B. Failure Rate Prediction

The failure rate will depend on the

junction temperature of the

Point^[1]

90% Confidence Level^[2]

MTTF

Junction

Temp.

T_J** ( °C)

MTTF*

( Hours)

FIT^[3]

( Hours)

FIT^[3]

device. The estimated life at

1.8 x 10⁶

4.4 x 10⁶

1.1 x 10⁶

2.9 x 10⁷

2.4 x 10⁸

4.8 x 10⁹

1.5 x 10¹¹

556.0

227.0

91.0

34.0

4.0

7.8 x 10⁵

1.9 x 10⁶

4.8 x 10⁶

1.3 x 10⁷

1.0 x 10⁸

2.1 x 10⁹

6.5 x 10¹⁰

1282.0

526.0

208.0

77.0

different temperatures is calcu-

lated, using the Arrhenius plot

with activation energy of 1.33 eV,

and listed in the following table.

150

140

130

120

100

10.0

0.48

0.015

0.20

0.007

*MTTF data collected in Hermetic and Plastic Packages.

**T_Jwas calculated using a θ_JAof 500°C/W.

(Notes on reverse side.)

12 3 4

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