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HN3G01J-BL(TE85L) PDF预览

HN3G01J-BL(TE85L)

更新时间: 2024-11-06 21:04:11
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 358K
描述
Small Signal Field-Effect Transistor

HN3G01J-BL(TE85L) 技术参数

生命周期:Active包装说明:,
Reach Compliance Code:unknown风险等级:5.63
Base Number Matches:1

HN3G01J-BL(TE85L) 数据手册

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HN3G01J  
TOSHIBA TRANSISTOR SILICON N CHANNEL JUNCTION TYPE FET SILICON NPN  
EPITAXIAL TYPE TRANSISTOR  
HN3G01J  
High Frequency Amplifier Applications  
AM High Frequency Amplifier Applications  
Audio Frequency Amplifier Applications  
Unit in mm  
Absolute Maximum Ratings (Ta = 25°C)  
Q1: FET  
CHARACTERISTIC  
Gate-Drain Voltage  
SYMBOL  
RATING  
UNIT  
V
20  
V
GDS  
Gate Current  
I
10  
mA  
G
Q2: TRANSISTOR  
CHARACTERISTIC  
SYMBOL  
RATING  
UNIT  
Collector-Base Voltage  
Collector-Emitter Voltage  
Emitter-Base Voltage  
Collector Current  
V
V
60  
50  
5
V
V
CBO  
CEO  
/
C
V
EBO  
JEDEC  
JEITA  
I
150  
30  
mA  
mA  
C
Base Current  
I
B
TOSHIBA  
23L1B  
Weight: 0.014 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Common Ratings  
CHARACTERISTIC  
SYMBOL  
P*  
RATING  
UNIT  
Power Dissipation  
200  
125  
mW  
°C  
Junction Temperature  
Storage Temperature Range  
T
j
T
stg  
–55~125  
°C  
*:  
Total Rating  
1
2007-11-01  

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