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HN1C03F-A PDF预览

HN1C03F-A

更新时间: 2024-11-12 13:08:23
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体开关小信号双极晶体管光电二极管PC
页数 文件大小 规格书
5页 307K
描述
TRANSISTOR 300 mA, 20 V, 2 CHANNEL, NPN, Si, SMALL SIGNAL TRANSISTOR, 2-3N1A, 6 PIN, BIP General Purpose Small Signal

HN1C03F-A 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PDSO-G6
针数:6Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.95
风险等级:5.4Is Samacsys:N
最大集电极电流 (IC):0.3 A基于收集器的最大容量:7 pF
集电极-发射极最大电压:20 V配置:SEPARATE, 2 ELEMENTS
最小直流电流增益 (hFE):200JESD-30 代码:R-PDSO-G6
JESD-609代码:e0元件数量:2
端子数量:6最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:NPN
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:TIN LEAD
端子形式:GULL WING端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
标称过渡频率 (fT):30 MHzVCEsat-Max:0.1 V
Base Number Matches:1

HN1C03F-A 数据手册

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HN1C03F  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
HN1C03F  
For Muting And Switching Applications  
Unit in mm  
z Including two devices in SM6 (Super mini type with 6 leads)  
z High emitter-base voltage: VEBO = 25V (min)  
z High reverse hFE: reverse hFE = 150 (typ.)(VCE =2V, IC =4mA)  
z Low on resistance: RON = 1(typ.)(IB = 5mA)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 Common)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
50  
20  
V
V
CBO  
CEO  
EBO  
25  
V
I
300  
mA  
mA  
mW  
°C  
°C  
C
JEDEC  
Base current  
I
60  
B
EIAJ  
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
300  
C
TOSHIBA  
Weight: 0.015g  
2-3N1A  
T
j
150  
T
55~150  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*
Total rating  
1
2007-11-01  

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