Datasheet > HEDL-5500

HEDL-5500

更新时间： 2024-11-04 03:41:35

品牌	Logo	应用领域
安华高科 - AVAGO		光电编码器
页数	文件大小	规格书
2页	94K
描述
Motion Sensing Products, Optical Encoder Modules

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中文翻译

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HEDL-5500 数据手册

HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series

Motion Sensing Products, Optical Encoder Modules

Reliability Data Sheet

Description

Failure Rate Prediction

The following cumulative test results have been obtained The failure rate of semiconductor devices is determined

from testing performed at Avago Technologies Malaysia by the junction temperature of the device. The relation-

in accordance with the latest revisions of JEDEC standards ship between ambient temperature and actual junction

temperature is given by the following:

Avago tests parts at the absolute maximum rated condi-

tions recommended for the device. The actual perfor- T (°C) = T (°C) + θ P

JA AVG

mance you obtain from Avago parts depends on the where T = ambient temperature in °C

electrical and environmental characteristics of your appli-

cation but will probably be better than the performance

outlined in Table 1.

= thermal resistance of junction-to-ambient in °C/Watt

AVG

= average power dissipated in Watt

The estimated MTTF and failure rate at temperatures

lower than the actual stress temperature can be deter-

mined by using an Arrhenius model for temperature

acceleration. Results of such calculations are shown in

the table below using an activation energy of 0.43eV

(reference MIL-HDBK-217).

Table 1. Life Tests

Demonstrated Performance

Point Typical Performance

Total Device

Hours

30,000

Units

Tested

Total

Failed

Failure Rate

(% /1 K Hours)

[3]

Test Name

Stress Test Conditions

MTTF

High Temperature Operating Life Vcc=5.0V, T =ꢀ00°C

32,700

3.06

ꢀ

中文翻译

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HEDL-5500#A01	AGILENT	获取价格	Optoelectronic Device
HEDL-5500#A02	AVAGO	获取价格	SPECIALTY OPTOELECTRONIC DEVICE
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HEDL-5500#A14	AVAGO	获取价格	Optoelectronic Device
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HEDL-5500#E01	AGILENT	获取价格	SPECIALTY OPTOELECTRONIC DEVICE