GS8161Z18(T/D)/GS8161Z32(D)/GS8161Z36(T/D)
100-Pin TQFP
Commercial Temp
Industrial Temp
250 MHz–133 MHz
18Mb Pipelined and Flow Through
Synchronous NBT SRAM
2.5 V or 3.3 V V
DD
2.5 V or 3.3 V I/O
Because it is a synchronous device, address, data inputs, and
read/ write control inputs are captured on the rising edge of the
input clock. Burst order control (LBO) must be tied to a power
rail for proper operation. Asynchronous inputs include the
Sleep mode enable, ZZ and Output Enable. Output Enable can
be used to override the synchronous control of the output
drivers and turn the RAM's output drivers off at any time.
Write cycles are internally self-timed and initiated by the rising
edge of the clock input. This feature eliminates complex off-
chip write pulse generation required by asynchronous SRAMs
and simplifies input signal timing.
Features
• User-configurable Pipeline and Flow Through mode
• NBT (No Bus Turn Around) functionality allows zero wait
read-write-read bus utilization
• Fully pin-compatible with both pipelined and flow through
NtRAM™, NoBL™ and ZBT™ SRAMs
• IEEE 1149.1 JTAG-compatible Boundary Scan
• 2.5 V or 3.3 V +10%/–10% core power supply
• LBO pin for Linear or Interleave Burst mode
• Pin-compatible with 2M, 4M, and 8M devices
• Byte write operation (9-bit Bytes)
• 3 chip enable signals for easy depth expansion
• ZZ pin for automatic power-down
• JEDEC-standard 100-lead TQFP and 165-bump FP-BGA
packages
The GS8161Z18(T/D)/GS8161Z32(D)/GS8161Z36(T/D) may
be configured by the user to operate in Pipeline or Flow
Through mode. Operating as a pipelined synchronous device,
in addition to the rising-edge-triggered registers that capture
input signals, the device incorporates a rising-edge-triggered
output register. For read cycles, pipelined SRAM output data is
temporarily stored by the edge triggered output register during
the access cycle and then released to the output drivers at the
next rising edge of clock.
Functional Description
The GS8161Z18(T/D)/GS8161Z32(D)/GS8161Z36(T/D) is an
18Mbit Synchronous Static SRAM. GSI's NBT SRAMs, like
ZBT, NtRAM, NoBL or other pipelined read/double late write
or flow through read/single late write SRAMs, allow
utilization of all available bus bandwidth by eliminating the
need to insert deselect cycles when the device is switched from
read to write cycles.
The GS8161Z18(T/D)/GS8161Z32(D)/GS8161Z36(T/D) is
implemented with GSI's high performance CMOS technology
and is available in JEDEC-standard 100-pin TQFP and
165-bump FP-BGA packages.
Parameter Synopsis
-250 -225 -200 -166 -150 -133 Unit
Pipeline
3-1-1-1
t
2.5 2.7 3.0 3.4 3.8 4.0 ns
4.0 4.4 5.0 6.0 6.7 7.5 ns
KQ
tCycle
Curr (x18)
280 255 230 200 185 165 mA
3.3 V
2.5 V
Curr (x32/x36) 330 300 270 230 215 190 mA
Curr (x18) 275 250 230 195 180 165 mA
Curr (x32/x36) 320 295 265 225 210 185 mA
Flow
Through
2-1-1-1
t
5.5 6.0 6.5 7.0 7.5 8.5 ns
5.5 6.0 6.5 7.0 7.5 8.5 ns
KQ
tCycle
Curr (x18)
175 165 160 150 145 135 mA
3.3 V
2.5 V
Curr (x32/x36) 200 190 180 170 165 150 mA
Curr (x18) 175 165 160 150 145 135 mA
Curr (x32/x36) 200 190 180 170 165 150 mA
Rev: 2.15 11/2004
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© 1998, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.