■SPECIFICATIONS AND TEST METHODS
Specification
No
Item
Appearance
Test Method
Temperature
Compensating Type
No defects or abnormalities.
High Dielectric
Constant Type
Humidity
16
Set the capacitor at 40±2℃ and in 90 to 95% humiduty
(Steady State)
for 500±12 hours.
Within ±5% or± 0.5pF
(Whichever is larger)
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
Capacitance
Change
Remove and set for 24±2 hours at room temperature,
then measure.
F1,F5
:Within ±30%
30pF and over:Q≧350
10pF and over
［B1,B3,R1,R6,R7,C7,C8,L8］
Q/D.F.
W.V.:100V :0.05max.( C＜0.068mF)
:0.075max.(C≧0.068mF)
W.V.:50V/25V :0.05max.
30pF and below:Q≧275+5C/2
10pF and below:Q≧200+10C
W.V.:16V/10V :0.05max.
C:Nominal Capacitance(pF)
W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 1,000MW or 50W·F(Whichever is smaller)
Humidity Load
No defects or abnormalities.
17
Appearance
Apply the rated voltage at 40±2℃ and 90 to 95% humidity
for 500±12 hours. Remove and set for 24±2 hours at room
temprature, then muasure. The charge/discharge current
is less than 50mA.
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
F1,F5 :Within ±30%
Within ±7.5% or±0.75pF
Capacitance
Change
(Whichever is larger)
[W.V.:10Vmax.]
F1 :Within+30/-40%
30pF and over:Q≧200
［B1,B3,R1,R6,R7,C7,C8,L8］
W.V.:100V :0.05max.( C＜0.068mF)
:0.075max.(C≧0.068mF)
Q/D.F.
• Initial measurement for F1/10Vmax.
30pF and below:Q≧100+10C/3
Apply the rated DC voltage for 1 hour at 40±2℃.
Remove and set for 24±2 hours at room temperature.
Perform initial measurement.
C:Nominal Capacitance(pF) W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 500MΩ or 25Ω·F(Whichever is smaller)
High Temperature
Load
18
Appearance No defects or abnormalities.
Apply 200% of the rated voltage at the maximum
operating temperature±3℃ for 1000±12 hours.
Set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
Within ±3% or ±0.3pF
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
F1,F5 :Within ±30%
Capacitance
Change
(Whichever is larger)
[Except 35V,10Vmax and C≧1.0. mF]
F1 :Within+30/-40%
[35V, 10Vmax and C≧1.0. mF]
［B1,B3,R1,R6,R7,C7,C8,L8］
30pF and over:Q≧350
10pF and over
･Initial measurement for high dielectric constant type.
Apply 200% of the rated DC voltage at the maximun operating
temperature ±3°C for one hour. Remove and set for
24±2 hours at room temperature.
Q/D.F.
W.V.:100V :0.05max.( C＜0.068mF)
:0.075max.(C≧0.068mF)
W.V.:50V/25V :0.05max.
30pF and below: Q≧275+5C/2
10pF and below:Q≧200+10C
W.V.:16V/10V :0.05max.
Perform initial measurement.
C:Nominal Capacitance (pF)
W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 1,000MW or 50W·F(Whichever is smaller)
Table A
Char.
Capacitance Change from 20C (%)
Nominal
Values
-55
-25
-10
(ppm/C) *
0± 60
0±120
0±250
Max.
0.82
1.37
2.56
Min.
-0.45
-0.90
-1.88
Max.
0.49
0.82
1.54
1.32
1.65
2.36
1.70
2.03
2.74
2.30
2.63
3.35
3.07
3.40
4.12
4.94
5.65
-
Min.
-0.27
-0.54
-1.13
0.41
0.14
-0.45
0.72
0.45
-0.14
1.22
0.95
0.36
1.85
1.58
0.99
2.84
2.25
-
Max.
0.33
0.55
1.02
0.88
1.10
1.57
1.13
1.35
1.83
1.54
1.76
2.23
2.05
2.27
2.74
3.29
3.77
-
Min.
-0.18
-0.36
-0.75
0.27
0.09
-0.30
0.48
0.30
-0.09
0.81
0.63
0.24
1.23
1.05
0.66
1.89
1.50
-
2C/0C
3C
4C
2P
3P
4P
2R
3R
4R
2S
3S
4S
2T
-150± 60
-150±120
-150±250
-220± 60
-220±120
-220±250
-330± 60
-330±120
-330±250
-470± 60
-470±120
-470±250
-750±120
-750+250
+350 to -1000
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
3T
4T
3U
4U
1X
* Nominalvaluesdenotethe temperaturecoefficientwithina rangeof20Cto 125C(for C)/ 150C(for0C)/85C(forotherTC).
JEMCGS-0001S
4
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