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FQT1N80TFWS PDF预览

FQT1N80TFWS

更新时间: 2024-09-30 12:04:07
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
8页 802K
描述
N-Channel MOSFET

FQT1N80TFWS 数据手册

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November 2007  
®
QFET  
FQT1N80  
N-Channel MOSFET  
800V, 0.2A, 20Ω  
Features  
Description  
RDS(on) = 15.5(Typ.)@ VGS = 10V, ID = 0.1A  
Low gate charge ( Typ. 5.5nC)  
Low Crss ( Typ. 2.7pF)  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficient switched mode power supplies and active power factor  
correction.  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
RoHS compliant  
D
D
S
G
G
SOT-223  
FQT Series  
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted*  
Symbol  
VDSS  
VGSS  
Parameter  
FQT1N80  
800  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
V
V
±30  
-Continuous (TC = 25oC)  
-Continuous (TC = 100oC)  
- P ul sed  
0.2  
ID  
D r a in C u r r e n t  
A
0.12  
0.8  
IDM  
D rai n Cur rent  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
A
mJ  
A
EAS  
IAR  
Single Pulsed Avalanche Energy  
Avalanche Current  
90  
0.2  
EAR  
dv/dt  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
0.2  
mJ  
V/ns  
W
W/oC  
oC  
4.0  
(TC = 25oC)  
- Derate above 25oC  
2.1  
PD  
Power Dissipation  
0.02  
-55 to +150  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
Maximum Lead Temperature for Soldering Purpose,  
1/8” from Case for 5 Seconds  
300  
oC  
Thermal Characteristics  
Symbol  
Parameter  
Thermal Resistance, Junction to Ambient*  
Units  
oC/W  
Min.  
Max.  
RθJA  
-
60  
* When mounted on the minimum pad size recommended (PCB Mount)  
©2007 Fairchild Semiconductor Corporation  
FQT1N80 Rev. A  
1
www.fairchildsemi.com  

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