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FQI58N08TU PDF预览

FQI58N08TU

更新时间: 2024-11-25 19:22:27
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 开关脉冲晶体管
页数 文件大小 规格书
11页 664K
描述
Power Field-Effect Transistor, 57.5A I(D), 80V, 0.024ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-262AA, I2PAK-3

FQI58N08TU 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TO-262包装说明:IN-LINE, R-PSIP-T3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.92
雪崩能效等级(Eas):560 mJ配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:80 V最大漏极电流 (Abs) (ID):57.5 A
最大漏极电流 (ID):57.5 A最大漏源导通电阻:0.024 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-262AA
JESD-30 代码:R-PSIP-T3JESD-609代码:e0
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:175 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):146 W
最大脉冲漏极电流 (IDM):230 A认证状态:Not Qualified
子类别:FET General Purpose Power表面贴装:NO
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQI58N08TU 数据手册

 浏览型号FQI58N08TU的Datasheet PDF文件第2页浏览型号FQI58N08TU的Datasheet PDF文件第3页浏览型号FQI58N08TU的Datasheet PDF文件第4页浏览型号FQI58N08TU的Datasheet PDF文件第5页浏览型号FQI58N08TU的Datasheet PDF文件第6页浏览型号FQI58N08TU的Datasheet PDF文件第7页 
December 2000  
TM  
QFET  
FQB58N08 / FQI58N08  
80V N-Channel MOSFET  
General Description  
Features  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary,  
planar stripe, DMOS technology.  
57.5A, 80V, R  
= 0.024@V = 10 V  
DS(on) GS  
Low gate charge ( typical 50 nC)  
Low Crss ( typical 120 pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
This advanced technology is especially tailored to minimize  
on-state  
resistance,  
provide  
superior  
switching  
performance, and withstand a high energy pulse in the  
avalanche and commutation modes. These devices are  
well suited for low voltage applications such as automotive,  
high efficiency switching for DC/DC converters, and DC  
motor control.  
175°C maximum junction temperature rating  
D
!
D
"
! "  
"
!
G
"
G
S
D2-PAK  
FQB Series  
I2-PAK  
FQI Series  
G
D
S
!
S
Absolute Maximum Ratings  
T = 25°C unless otherwise noted  
C
Symbol  
Parameter  
FQB58N08 / FQI58N08  
Units  
V
V
I
Drain-Source Voltage  
80  
57.5  
DSS  
- Continuous (T = 25°C)  
Drain Current  
A
D
C
- Continuous (T = 100°C)  
40.6  
A
C
I
(Note 1)  
Drain Current  
- Pulsed  
230  
A
DM  
V
E
I
Gate-Source Voltage  
± 25  
V
GSS  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
560  
mJ  
A
AS  
57.5  
AR  
E
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
14.6  
mJ  
V/ns  
W
AR  
dv/dt  
6.5  
Power Dissipation (T = 25°C) *  
3.75  
P
A
D
Power Dissipation (T = 25°C)  
146  
W
C
- Derate above 25°C  
Operating and Storage Temperature Range  
0.97  
W/°C  
°C  
T , T  
-55 to +175  
J
STG  
Maximum lead temperature for soldering purposes,  
1/8from case for 5 seconds  
T
300  
°C  
L
Thermal Characteristics  
Symbol  
Parameter  
Typ  
--  
Max  
1.03  
40  
Units  
°C/W  
°C/W  
°C/W  
R
R
R
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient *  
Thermal Resistance, Junction-to-Ambient  
θJC  
θJA  
θJA  
--  
--  
62.5  
* When mounted on the minimum pad size recommended (PCB Mount)  
©2000 Fairchild Semiconductor International  
Rev. A2, December 2000  

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