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FLK107XV PDF预览

FLK107XV

更新时间: 2024-11-21 03:37:07
品牌 Logo 应用领域
EUDYNA 晶体晶体管
页数 文件大小 规格书
4页 63K
描述
GaAs FET & HEMT Chips

FLK107XV 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:DIE
包装说明:UNCASED CHIP, R-XUUC-N8针数:8
Reach Compliance Code:unknown风险等级:5.34
Is Samacsys:N其他特性:HIGH RELIABILITY
配置:SINGLE最小漏源击穿电压:15 V
FET 技术:HIGH ELECTRON MOBILITY最高频带:KU BAND
JESD-30 代码:R-XUUC-N8元件数量:1
端子数量:8工作模式:DEPLETION MODE
封装主体材料:UNSPECIFIED封装形状:RECTANGULAR
封装形式:UNCASED CHIP峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL认证状态:Not Qualified
表面贴装:YES端子形式:NO LEAD
端子位置:UPPER处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管元件材料:GALLIUM ARSENIDEBase Number Matches:1

FLK107XV 数据手册

 浏览型号FLK107XV的Datasheet PDF文件第2页浏览型号FLK107XV的Datasheet PDF文件第3页浏览型号FLK107XV的Datasheet PDF文件第4页 
FLK107XV  
GaAs FET & HEMT Chips  
FEATURES  
High Output Power: P  
= 30.0dBm(Typ.)  
1dB  
High Gain: G  
High PAE: η  
= 6.5dB(Typ.)  
= 31%(Typ.)  
1dB  
add  
Drain  
Drain  
Drain  
Drain  
Proven Reliability  
DESCRIPTION  
The FLK107XV chip is a power GaAs FET that is  
designed for general purpose applications in the Ku-Band  
frequency range as it provides superior power, gain, and  
efficiency.  
Gate  
Gate  
Gate  
Gate  
Fujitsu’s stringent Quality Assurance Program assures the  
highest reliability and consistent performance.  
ABSOLUTE MAXIMUM RATING (Ambient Temperature Ta=25°C)  
Item  
Symbol  
Condition  
Unit  
Rating  
Drain-Source Voltage  
Gate-Source Voltage  
V
DS  
V
GS  
15  
-5  
V
V
P
T
T = 25°C  
c
Total Power Dissipation  
Storage Temperature  
7.50  
W
°C  
°C  
tot  
-65 to +175  
stg  
T
Channel Temperature  
175  
ch  
Fujitsu recommends the following conditions for the reliable operation of GaAs FETs:  
1. The drain-source operating voltage (V ) should not exceed 10 volts.  
DS  
2. The forward and reverse gate currents should not exceed 8.8 and -0.5 mA respectively with  
gate resistance of 500.  
3. The operating channel temperature (T ) should not exceed 145°C.  
ch  
ELECTRICAL CHARACTERISTICS (Ambient Temperature Ta=25°C)  
Limit  
Typ.  
Item  
Symbol  
Test Conditions  
Unit  
Min.  
Max.  
600  
-
V
V
V
I
= 5V, V  
= 0V  
GS  
Saturated Drain Current  
Transconductance  
I
-
400  
mA  
DS  
DS  
DS  
DSS  
g
= 5V, I  
= 250mA  
= 20mA  
m
-
200  
mS  
V
DS  
Pinch-off Voltage  
V
= 5V, I  
DS  
-1.0 -2.0  
-3.5  
-
p
Gate Source Breakdown Voltage  
V
-
= -20µA  
-5  
V
GSO  
GS  
Output Power at 1dB  
Gain Compression Point  
P
1dB  
-
-
29  
30  
dBm  
dB  
V
= 10V  
DS  
Power Gain at 1dB  
Gain Compression Point  
I
0.6I  
DS  
DSS  
5.5  
6.5  
G
1dB  
f = 14.5GHz  
η
-
Power-added Efficiency  
Thermal Resistance  
-
-
31  
15  
%
add  
R
Channel to Case  
20  
°C/W  
th  
Note: RF parameter sample size 10pcs. criteria (accept/reject)=(2/3)  
The chip must be enclosed in a hermetically sealed environment for optimum performance and reliability.  
Edition 1.3  
July 1999  
1

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