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F3M-S825 PDF预览

F3M-S825

更新时间: 2024-11-21 01:01:19
品牌 Logo 应用领域
欧姆龙 - OMRON /
页数 文件大小 规格书
7页 316K
描述
Silicon Wafer Mapping Sensor

F3M-S825 数据手册

 浏览型号F3M-S825的Datasheet PDF文件第2页浏览型号F3M-S825的Datasheet PDF文件第3页浏览型号F3M-S825的Datasheet PDF文件第4页浏览型号F3M-S825的Datasheet PDF文件第5页浏览型号F3M-S825的Datasheet PDF文件第6页浏览型号F3M-S825的Datasheet PDF文件第7页 
R
Silicon Wafer Mapping Sensor  
F3M-S  
Allows Simultaneous Mapping of up  
to 25 Silicon Wafers  
H Economical, one sensor detects most  
wafer types, including dummy wafers  
H Models match wafer sizes of 300 mm,  
200 mm and 150 mm  
H Automatic and remote teaching  
capability  
H Self-diagnostic functions reduce  
downtime  
Ordering Information  
Applicable wafer size  
Number of cassette slots  
Function  
Remarks  
Part number  
F3M-S625  
F3M-S626  
F3M-S825  
F3M-S826  
F3M-S1213  
F3M-S1225  
6 inches (4.76-mm pitch)  
25  
26  
25  
26  
13  
25  
Self-diagnosis  
---  
---  
---  
8 inches (6.35-mm pitch)  
12 inches (10-mm pitch)  
Self-diagnosis  
---  
---  
---  
Self-diagnosis  
Self-diagnosis  
CE marking  
CE marking  
Application Examples  
Detects Transparent Glass Wafers  
with a Transparency of 92%  
(F3M-S6j and F3M-S8j)  
Answer-back Alarms for Setting Errors and  
Self-diagnostic Alarms for Operation Errors  
These alarms help reduce system downtime and shorten  
The F3M-S allows the mapping of cassettes that have both  
silicon wafers and glass wafers. The F3M-S also accurately  
detects dummy wafers in the carrier used to test coating or  
processing tolerances.  
troubleshooting time.  
Note: The self-diagnostic output function is not incorporated by  
the F3M-S826/-S626.  
Static Electricity Protection  
Automatic Teaching Saves Setting Time  
Remote Teaching Available  
The F3M-S has an automatic teaching function that ensures easy  
adjustments within a minimal time. The remote teaching function  
allows quick, on-the-fly set up.  
OMRONs optical system, including an emitter and receiver,  
prevents Sensor malfunction and damage by protecting the  
Sensor from static electricity that may be charged on  
semiconductor wafers at the time of mapping.  
2

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