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EVM4287AHFT

更新时间： 2024-02-22 08:53:01
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商升特 - SEMTECH /
页数 文件大小 规格书
39页 245K
描述
Dual Channel Per-Pin Parametric Measurement Unit

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EVM4287AHFT 数据手册

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E4237/E4257/E4287  
Dual Channel Per-Pin  
Parametric Measurement Unit  
TEST AND MEASUREMENT PRODUCTS  
Description  
The E42X7 is designed to be a low power, low cost, small  
footprint solution to allow high pin count testers to support  
a PMU per-pin.  
E42X7 is a family of Dual Channel Parametric Measure-  
ment Units (PMU) designed for automated test equip-  
ment and instrumentation. Manufactured in a wide volt-  
age Bi-CMOS process, it is a monolithic solution for a  
per-pin PMU.  
Features  
The E42X7 family consists of three products:  
• Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)  
• 4 Current Ranges (± 40 µA, ± 400 µA, ± 4 mA,  
± 40 mA) (E4287, E4257)  
• 2 Current Ranges (± 40 µA and ± 4 mA) (E4237)  
• Wide Output Voltage Range  
– –3.25V to + 13V @ RF pin across all ranges  
– –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C)  
– –1.25V to + 11V @ FORCE (Range D)  
• Low Power Dissipation  
E4287  
•
•
•
16.25V I/O range  
4 current ranges up to ± 40 mA  
Analog mux for providing a FLASHTM  
programming level  
•
Driven guard pin  
E4257  
•
•
•
16.25V I/O range  
4 Current ranges up to ± 40 mA  
Small 9mm x 9mm footprint  
• FV Linearity to ± 0.025% FSVR  
• Extremely Fast Settling Times offer reduced test  
times/increased tester thru-put.  
• Central PMU Switches for External PMU,  
–4.75 V to + 14.5V, ± 40 mA Ranges  
• Switches for Pin Driver Super Voltages  
• Driven Guard Output (E4287)  
• Test Head Ground Reference  
• Stable with up to 300 pF Capacitive Loading with no  
external compensation capacitors  
• Switchable Compensation allows stability with up to  
10 nF Capacitive Loading  
• 14x14 mm, 80 Pin MQFP Package (E4287)  
• Small, 9x9 mm, 64-Pad LPCC Package (E4237,  
E4257)  
E4237  
•
•
•
16.25VI/O range  
2 current ranges up to ± 4 mA  
Low capacitance for use in relayless tester  
architectures  
Every member of the E42X7 family can drive capacitive  
loads of up to 300 pF with no external compensation  
components. A user selectable FORCE amplifier  
compensation switch allows users to add compensation  
components for stability with larger capacitive loads.  
Integrated voltage clamp circuitry provides a method for  
clamping DUT (Device Under Test) compliance voltage and  
protecting the DUT from damage.  
Applications  
Each channel of the E42X7 also features an on-board  
window comparator that can be used to determine if a  
measurement value is within a user defined range for go/  
no-go testing.  
• Automated Test Equipment  
– Memory Testers  
– Logic Testers  
– Mixed Signal Testers  
– SOC Testers  
• Instrumentation  
Also included with the E42X7 are a number of integrated  
switches that allow the connection of a central “system”  
PMU to the E42X7 FORCE and SENSE pins and allow the  
E42X7 to provide “pull-up” or “pull-down” resistors and  
termination voltages for DUTs with open element outputs.  
www.semtech.com  
1
Revision 5 / November 30, 2005  
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