Edge4717D
Quad Channel, Per Pin
Precision Measurement Unit
TEST AND MEASUREMENT PRODUCTS
Features
Description
The Edge4717D is a precision measurement unit designed
for automated test equipment and instrumentation.
Manufactured in a wide voltage CMOS process, it is a
monolithic solution for a quad channel per pin PMU.
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FV / MI Capability
FI / MV Capability
FV / MV Capability
FI / MI Capability
4 Current Ranges (± 3.2 µA, ± 80 µA, ± 2 mA,
± 30 mA)
–5.5V to 9.5V Nominal Output Range (Zero Current)
–3.5 to 7.5V Nominal Output Range (Full Scale
Current)
Each channel of the Edge4717D features a PMU that
can force or measure voltage over a typical 15V I/O range,
and supports 4 current ranges: ± 3.2 µA, ± 80 µA,
± 2 mA, ± 30 mA.
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On-board Voltage Clamps
Internal Sample and Hold
228 Pin 23 mm x 23 mm TBGA Package
The Edge4717D has an on-board window comparator per
channel that provides two bits of information — DUT too
high and DUT too low. There is also a monitor pin which
provides a real time analog signal proportional to either
the voltage or current measured at the DUT.
Functional Block Diagram
DUT_GND
The Edge4717D is designed to be a low power, low cost,
small footprint solution to allow high pin count testers to
support a PMU per pin.
CHANNEL 0
OVER-CURRENT
SNK_MON
DETECT
SNK_OUT
OPEN_RLY
OVER-CURRENT
SRC_MON
SRC_OUT
DETECT
HiZ
VINP
FORCE
GUARD
2.5
÷
REF
On-board voltage clamps, with over-current detection,
provide protection to the DUT and 4717D.
FV / FI*
MI / MV*
SENSE
DUTLTH
IVMAX
IVMIN
COMP_IN
DISABLE
COMPARATORS
DETECTOR LOGIC
DUTGTL
IVMON
VOLTAGE MONITOR
The Edge4717D also has a sample-and-hold feature
a va ila ble for ca pturing DUT curre nt or volta ge
measurements.
CHANNEL 1
OVER-CURRENT
DETECT
SNK_MON
SNK_OUT
OPEN_RLY
OVER-CURRENT
DETECT
SRC_MON
HiZ
SRC_OUT
VINP
FORCE
GUARD
2.5
÷
The Edge4717D is a design improvement to the Edge4717
that features:
REF
FV / FI*
MI / MV*
SENSE
DUTLTH
IVMAX
IVMIN
COMP_IN
DISABLE
COMPARATORS
DETECTOR LOGIC
DUTGTL
IVMON
– Increased FV/MV range
VOLTAGE MONITOR
– Improved over-current detection circuit
functionality
CHANNEL 2
OVER-CURRENT
DETECT
SNK_MON
SNK_OUT
OPEN_RLY
OVER-CURRENT
DETECT
– LVTTL comparator outputs (pull-up resistors
no longer required)
– Improved HiZ switching characteristics
– Improved Force Voltage Linearity
SRC_MON
HiZ
SRC_OUT
VINP
FORCE
GUARD
2.5
÷
REF
FV / FI*
MI / MV*
SENSE
DUTLTH
IVMAX
IVMIN
COMP_IN
DISABLE
COMPARATORS
DETECTOR LOGIC
DUTGTL
IVMON
VOLTAGE MONITOR
CHANNEL 3
OVER-CURRENT
DETECT
SNK_MON
SNK_OUT
OPEN_RLY
Applications
OVER-CURRENT
DETECT
SRC_MON
HiZ
SRC_OUT
VINP
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Automated Test Equipment
- Memory Testers
- VLSI Testers
FORCE
GUARD
2.5
÷
REF
FV / FI*
MI / MV*
SENSE
DUTLTH
IVMAX
IVMIN
COMP_IN
DISABLE
COMPARATORS
DETECTOR LOGIC
VOLTAGE MONITOR
- Mixed Signal Tester
DUTGTL
IVMON
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Revision 5 / October 14, 2005