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ESD7108 PDF预览

ESD7108

更新时间: 2024-02-29 01:30:37
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
5页 116K
描述
ESD Protection Diode

ESD7108 技术参数

是否无铅: 不含铅生命周期:Active
Reach Compliance Code:compliantFactory Lead Time:9 weeks
风险等级:5.77击穿电压标称值:7 V
最大钳位电压:19.5 V二极管类型:TRANS VOLTAGE SUPPRESSOR DIODE
JESD-609代码:e3湿度敏感等级:1
极性:BIDIRECTIONAL最大重复峰值反向电压:5 V
子类别:Transient Suppressors表面贴装:YES
端子面层:Tin (Sn)Base Number Matches:1

ESD7108 数据手册

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ESD7108  
ESD Protection Diode  
Low Capacitance Array for High Speed  
Data Lines  
The ESD7108 transient voltage suppressor is designed specifically  
to protect four high speed differential pairs. Ultra−low capacitance and  
low ESD clamping voltage make this device an ideal solution for  
protecting voltage sensitive high speed data lines. The flow−through  
style package allows for easy PCB layout and matched trace lengths  
necessary to maintain consistent impedance for the high speed lines.  
http://onsemi.com  
MARKING  
DIAGRAM  
18  
1
7108M  
UDFN18  
CASE 517BV  
G
Features  
Integrated 4 Pairs (8 Lines) High Speed Data  
Single Connect, Flow through Routing  
Low Capacitance (0.25 pF Max, I/O to GND)  
7108  
M
G
= Specific Device Code  
= Date Code  
= Pb−Free Package  
Protection for the Following IEC Standards:  
IEC 61000−4−2 Level 4  
UL Flammability Rating of 94 V−0  
ORDERING INFORMATION  
This is a Pb−Free Device  
Device  
ESD7108MUTAG  
Package  
Shipping  
Typical Applications  
V−by−One HS  
LVDS  
UDFN18 3000 / Tape & Reel  
(Pb−Free)  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specification  
Brochure, BRD8011/D.  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Rating  
Symbol  
Value  
55 to +125  
55 to +150  
260  
Unit  
°C  
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
T
stg  
°C  
Lead Solder Temperature −  
Maximum (10 Seconds)  
T
L
°C  
IEC 61000−4−2 Contact (ESD)  
IEC 61000−4−2 Air (ESD)  
ESD  
ESD  
15  
15  
kV  
kV  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
See Application Note AND8308/D for further description of  
survivability specs.  
© Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
June, 2014 − Rev. 0  
ESD7108/D  

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