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ESD5101PFCT5G PDF预览

ESD5101PFCT5G

更新时间: 2024-01-26 21:41:52
品牌 Logo 应用领域
安森美 - ONSEMI 二极管电视
页数 文件大小 规格书
8页 189K
描述
TVS DIODE

ESD5101PFCT5G 技术参数

是否Rohs认证: 符合生命周期:Obsolete
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8541.10.00.50风险等级:5.79
二极管类型:TRANS VOLTAGE SUPPRESSOR DIODE峰值回流温度(摄氏度):NOT SPECIFIED
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

ESD5101PFCT5G 数据手册

 浏览型号ESD5101PFCT5G的Datasheet PDF文件第2页浏览型号ESD5101PFCT5G的Datasheet PDF文件第3页浏览型号ESD5101PFCT5G的Datasheet PDF文件第4页浏览型号ESD5101PFCT5G的Datasheet PDF文件第5页浏览型号ESD5101PFCT5G的Datasheet PDF文件第6页浏览型号ESD5101PFCT5G的Datasheet PDF文件第7页 
ESD5101, ESD5111  
ESD Protection Diodes  
Micro−packaged Diodes for ESD  
Protection  
The ESD51x1 Series is designed to protect voltage sensitive  
components from ESD. Excellent clamping capability, low leakage,  
and fast response time provide best in class protection on designs that  
are exposed to ESD. Because of its small size, it is suited for use in  
smartphone, smart-watch, or many other portable / wearable  
applications where board space comes at a premium.  
www.onsemi.com  
MARKING  
DIAGRAMS  
ESD5101 (01005)  
DSN2  
Features  
L
Low Capacitance (5 pF Max, I/O to GND)  
CASE 152AK  
Small Body Outline Dimensions  
01005 Size: 0.435 x 0.23 mm  
0201 Size: 0.6 x 0.3 mm  
ESD5101P (01005)  
DSN2  
X
CASE TBD*  
Protection for the Following IEC Standards:  
IEC 61000−4−2 (Level 4)  
ESD5111 (0201)  
WLCSP2  
CASE 567AV  
Low ESD Clamping Voltage  
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS  
Compliant  
E M  
X M  
ESD5111P (0201)  
WLCSP2  
CASE TBD*  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Rating  
Symbol  
Value  
55 to +125  
55 to +150  
260  
Unit  
°C  
L, E, X = Device Code  
= Date Code  
M
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
* In Development  
T
stg  
°C  
Lead Solder Temperature −  
Maximum (10 Seconds)  
T
L
°C  
PIN CONFIGURATION  
AND SCHEMATIC  
IEC 61000−4−2 Contact (ESD)  
IEC 61000−4−2 Air (ESD)  
ESD  
ESD  
15  
15  
kV  
kV  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1
2
See Application Note AND8308/D for further description of  
survivability specs.  
This document contains information on some products that are still under development.  
ON Semiconductor reserves the right to change or discontinue these products without  
notice.  
=
ORDERING INFORMATION  
See detailed ordering and shipping information on page 2 of  
this data sheet.  
© Semiconductor Components Industries, LLC, 2015  
1
Publication Order Number:  
August, 2015 − Rev. 2  
ESD5101/D  

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