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EP3CLS100U484C8N PDF预览

EP3CLS100U484C8N

更新时间: 2024-01-23 00:06:29
品牌 Logo 应用领域
英特尔 - INTEL 时钟LTE可编程逻辑
页数 文件大小 规格书
32页 760K
描述
Field Programmable Gate Array, 100448 CLBs, 450MHz, 100448-Cell, CMOS, PBGA484, LEAD FREE, UBGA-484

EP3CLS100U484C8N 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:BGA
包装说明:LEAD FREE, UBGA-484针数:484
Reach Compliance Code:unknownECCN代码:3A991
HTS代码:8542.39.00.01风险等级:5.28
最大时钟频率:450 MHzJESD-30 代码:S-PBGA-B484
JESD-609代码:e1长度:19 mm
湿度敏感等级:3可配置逻辑块数量:100448
输入次数:278逻辑单元数量:100448
输出次数:278端子数量:484
最高工作温度:85 °C最低工作温度:
组织:100448 CLBS封装主体材料:PLASTIC/EPOXY
封装代码:FBGA封装等效代码:BGA484,22X22,32
封装形状:SQUARE封装形式:GRID ARRAY, FINE PITCH
峰值回流温度(摄氏度):260电源:1.2,1.2/3.3,2.5 V
可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY认证状态:Not Qualified
座面最大高度:2.05 mm子类别:Field Programmable Gate Arrays
最大供电电压:1.25 V最小供电电压:1.15 V
标称供电电压:1.2 V表面贴装:YES
技术:CMOS温度等级:OTHER
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:0.5 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:40宽度:19 mm
Base Number Matches:1

EP3CLS100U484C8N 数据手册

 浏览型号EP3CLS100U484C8N的Datasheet PDF文件第26页浏览型号EP3CLS100U484C8N的Datasheet PDF文件第27页浏览型号EP3CLS100U484C8N的Datasheet PDF文件第28页浏览型号EP3CLS100U484C8N的Datasheet PDF文件第30页浏览型号EP3CLS100U484C8N的Datasheet PDF文件第31页浏览型号EP3CLS100U484C8N的Datasheet PDF文件第32页 
Chapter 2: Cyclone III LS Device Datasheet  
2–29  
Glossary  
Table 2–39. Glossary (Part 4 of 6)  
Letter  
Term  
Definitions  
VCCIO  
VOH  
VIH AC  
(
)
VIH(DC)  
VREF  
VIL(DC)  
VIL(AC  
)
Single-ended  
Voltage  
referenced I/O  
Standard  
VOL  
VSS  
S
The JEDEC standard for SSTl and HSTL I/O standards defines both the AC and DC input signal  
values.  
The AC values indicate the voltage levels at which the receiver must meet its timing  
specifications.  
The DC values indicate the voltage levels at which the final logic state of the receiver is  
unambiguously defined.  
After the receiver input crosses the AC value, the receiver changes to the new logic state. The  
new logic state is then maintained as long as the input stays beyond the DC threshold. This  
approach is intended to provide predictable receiver timing in the presence of input waveform  
ringing.  
High-speed I/O Block: The period of time during which the data must be valid to capture it  
correctly. The setup and hold times determine the ideal strobe position in the sampling  
window.  
SW (Sampling  
Window)  
tC  
High-speed receiver and transmitter input and output clock period.  
TCCS (Channel-  
High-speed I/O Block: The timing difference between the fastest and slowest output edges,  
to-channel-skew) including tCO variation and clock skew. The clock is included in the TCCS measurement.  
tcin  
tCO  
Delay from the clock pad to the I/O input register.  
Delay from the clock pad to the I/O output.  
tcout  
tDUTY  
tFALL  
tH  
Delay from the clock pad to the I/O output register.  
High-speed I/O Block: Duty cycle on the high-speed transmitter output clock.  
Signal high-to-low transition time (80 to 20%).  
Input register hold time.  
T
Timing Unit  
Interval (TUI)  
High-speed I/O block: The timing budget allowed for skew, propagation delays, and the data  
sampling window. (TUI = 1/(Receiver Input Clock Frequency Multiplication Factor) = tC/w).  
tINJITTER  
Period jitter on the PLL clock input.  
tOUTJITTER_DEDCLK  
tOUTJITTER_IO  
tpllcin  
Period jitter on the dedicated clock output driven by a PLL.  
Period jitter on the general purpose I/O driven by a PLL.  
Delay from the PLL inclk pad to the I/O input register.  
Delay from the PLL inclk pad to the I/O output register.  
tpllcout  
July 2012 Altera Corporation  
Cyclone III Device Handbook  
Volume 2  

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