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EP16E7C2H-52.000M TR PDF预览

EP16E7C2H-52.000M TR

更新时间: 2024-11-02 14:37:55
品牌 Logo 应用领域
日蚀 - ECLIPTEK 石英晶振
页数 文件大小 规格书
5页 184K
描述
CMOS, Quartz Crystal Clock Oscillators XO (SPXO) LVCMOS (CMOS) 1.8Vdc 4 Pad 2.5mm x 3.2mm Ceramic Surface Mount (SMD) Quartz Crystal Clock Oscillators XO (SPXO) LVCMOS (CMOS) 1.8Vdc 4 Pad 2.5mm x 3.2mm Ceramic Surface Mount (SMD)

EP16E7C2H-52.000M TR 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Active零件包装代码:SMD 2.5mm x 3.2mm
针数:4Reach Compliance Code:163
风险等级:5.69Is Samacsys:N
老化:5 PPM/YEAR技术:CMOS
Base Number Matches:1

EP16E7C2H-52.000M TR 数据手册

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RoHS  
Pb  
EP16E7C2H-52.000M  
EP16E7 C 2 H -52.000M  
Series  
Nominal Frequency  
RoHS Compliant (Pb-free) 1.8V 4 Pad 2.5mm x 3.2mm  
Ceramic SMD LVCMOS Programmable Oscillator  
52.000MHz  
Pin 1 Connection  
Tri-State  
Frequency Tolerance/Stability  
±100ppm Maximum over -20°C to +70°C  
Duty Cycle  
50 ±5(%)  
ELECTRICAL SPECIFICATIONS  
Nominal Frequency  
52.000MHz  
Frequency Tolerance/Stability  
±100ppm Maximum over -20°C to +70°C (Inclusive of all conditions: Calibration Tolerance at 25°C,  
Frequency Stability over the Operating Temperature Range, Supply Voltage Change, Output Load Change,  
First Year Aging at 25°, 260°C Reflow, Shock, and Vibration)  
Aging at 25°C  
±5ppm/Year Maximum  
Supply Voltage  
1.8Vdc ±5%  
Input Current  
12mA Maximum  
Output Voltage Logic High (Voh)  
Output Voltage Logic Low (Vol)  
Rise/Fall Time  
90% of Vdd Minimum (IOH = -8mA)  
10% of Vdd Maximum (IOL = +8mA)  
4nSec Maximum (Measured at 20% to 80% of waveform)  
Duty Cycle  
50 ±5(%) (Measured at 50% of waveform)  
Load Drive Capability  
Output Logic Type  
Pin 1 Connection  
15pF Maximum  
CMOS  
Tri-State  
Pin 1 Input Voltage (Vih and Vil)  
Disable Current  
90% of Vdd Minimum or No Connect to Enable Output, 10% of Vdd Maximum to Disable Output  
4mA Maximum (Pin 1 = Ground)  
200pSec Maximum  
Absolute Clock Jitter  
Start Up Time  
10mSec Maximum  
Storage Temperature Range  
-55°C to 125°C  
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS  
ESD Susceptibility  
MIL-STD-883, Method 3015, Class 1, HBM: 1500Vdc  
MIL-STD-883, Method 1014, Condition A  
MIL-STD-883, Method 1014, Condition C  
MIL-STD-883, Method 2002, Condition B  
MIL-STD-883, Method 1004  
Fine Leak Test  
Gross Leak Test  
Mechanical Shock  
Moisture Resistance  
Moisture Sensitivity  
Resistance to Soldering Heat  
Resistance to Solvents  
Solderability  
J-STD-020, MSL 1  
MIL-STD-202, Method 210, Condition K  
MIL-STD-202, Method 215  
MIL-STD-883, Method 2003  
Temperature Cycling  
Thermal Shock  
MIL-STD-883, Method 1010, Condition B  
MIL-STD-883, Method 1011, Condition B  
MIL-STD-883, Method 2007, Condition A  
Vibration  
www.ecliptek.com | Specification Subject to Change Without Notice | Rev E 2/16/2010 | Page 1 of 5  

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