5秒后页面跳转
EDGE629 PDF预览

EDGE629

更新时间: 2024-09-19 06:55:55
品牌 Logo 应用领域
商升特 - SEMTECH /
页数 文件大小 规格书
16页 114K
描述
1 GHz Timing Deskew and Quad Fanout Element

EDGE629 数据手册

 浏览型号EDGE629的Datasheet PDF文件第2页浏览型号EDGE629的Datasheet PDF文件第3页浏览型号EDGE629的Datasheet PDF文件第4页浏览型号EDGE629的Datasheet PDF文件第5页浏览型号EDGE629的Datasheet PDF文件第6页浏览型号EDGE629的Datasheet PDF文件第7页 
Edge629  
1 GHz Timing Deskew and Quad  
Fanout Element  
TEST AND MEASUREMENT PRODUCTS  
Featur es  
Description  
Fmax 1 GHz  
The Edge629 is a monolithic timing delay and signal fanout  
solution manufactured in a high-performance bipolar pro-  
cess. In Automatic Test Equipment (ATE) applications, the  
Edge629 buffers, distributes, and aligns timing signals  
across multiple channels (typically found inside Memory  
Test Systems). It is also suitable for per pin deskew in  
Logic Testers.  
Independent Falling Edge Adjust  
Small Footprint (10 mm x 10 mm)  
Excellent Timing Accuracy  
Very Stable Timing Delays  
5 ps Resolution  
ECL, CMOS Compatible Inputs  
The Edge629 supports:  
Minimum pulse width = 330 ps with Falling  
Edge Adjust disabled, 500 ps with Falling  
Edge Adjust enabled  
Net usable delay span 4.0 ns  
Falling Edge Adjust ± 250 ps  
On Board DACs to generate 5 ps resolution  
With a maximum operating frequency of 1 GHz, the  
Edge629 is optimized for extremely high speed, high ac-  
curacy testers, particularly those aimed to test memory  
devices.  
Functional Block Diagram  
The Edge629 solves several difficult problems associated  
with aligning multiple timing signals because it can:  
IN0 / IN0*  
delay very narrow pulses over a long  
timing span  
adjust the falling edge independently from the overall  
propagation delay  
maintain extreme timing accuracy for very narrow  
(sub-ns) pulses  
maintain tight timing accuracy over changes in  
frequency, duty cycle, and pattern.  
T–  
T–  
T–  
T–  
T  
T  
OUT0 / OUT0*  
OUT1 / OUT1*  
OUT2 / OUT2*  
OUT3 / OUT3*  
IN / IN*  
Coarse  
Fine  
IN1/ IN1*  
T  
T  
Coarse  
Fine  
IN2 / IN2*  
T  
T  
Coarse  
Fine  
Applications  
IN3 / IN3*  
SEL / SEL*  
Memory Test Equipment  
– Data Fanout  
– Channel Deskew  
Logic Testers  
– Per Pin Deskew  
Clock / Signal Fanout  
T  
T  
Coarse  
Fine  
www .semtech.com  
Revision 3 / August 1, 2005  
1

与EDGE629相关器件

型号 品牌 获取价格 描述 数据表
EDGE6420 SEMTECH

获取价格

Per-Pin Electronics Companion DAC
EDGE6435 SEMTECH

获取价格

Per-Pin Electronics Companion DAC
EDGE6436 SEMTECH

获取价格

Per-Pin Electronics Companion DAC
EDGE646 SEMTECH

获取价格

Pin Electronics Driver, Window Comparator, and Switch Matrix
EDGE647 SEMTECH

获取价格

Pin Electronics Driver, Window Comparator, and Switch Matrix
EDGE649 SEMTECH

获取价格

Octal Pin Electronics Driver/Receiver
EDGE692 SEMTECH

获取价格

200 MHz Monolithic Dual Pin Electronics Driver
EDGE693 SEMTECH

获取价格

500 MHz Monolithic Dual Pin Electronics Driver
EDGE710 SEMTECH

获取价格

500 MHz Pin Electronics Driver, Window Comparator, and Load
EDGE737 SEMTECH

获取价格

Per-Pin Precision Measurement Unit