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EDGE710 PDF预览

EDGE710

更新时间: 2024-09-18 22:30:39
品牌 Logo 应用领域
商升特 - SEMTECH 驱动器比较器电子
页数 文件大小 规格书
17页 201K
描述
500 MHz Pin Electronics Driver, Window Comparator, and Load

EDGE710 数据手册

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Edge710  
500 MHz Pin Electronics Driver,  
Window Comparator, and Load  
EDGE HIGH-PERFORMANCE PRODUCTS  
Features  
Description  
The Edge710 is a totally monolithic ATE pin electronics  
solution manufactured in a high-performance  
complementary bipolar process. In Automatic Test  
Equipment (ATE) applications, the Edge710 incorporates  
a driver, a load, and a window comparator suitable for  
very fast bidirectional channels in VLSI, Mixed-Signal, and  
Memory test systems.  
Fully Integrated Three-Statable Driver, Window  
Comparator, and Dynamic Active Load  
12V Driver, Load, Compare Range  
13V Super Voltage Capable  
± 35 mA Programmable Load  
Comparator Input Tracking >6V/ns  
Leakage (L+D+C) < 1 µA (normal mode)  
Leakage (L+D+C) < 25 nA (IPD mode)  
Small footprint (52 pin MQFP)  
The three-statable driver is capable of generating 9V swings  
over a 12V range. In addition, 13V super voltage may be  
obtained under certain operating conditions. Separate  
rise and fall edge adjustments support both high speed  
and low speed applications, and allow for superior rise  
and fall time matching. An input power down mode allows  
extremely low leakage current in HiZ.  
Functional Block Diagram  
The load supports programmable source and sink currents  
of ± 35 mA over a 12V range, or it can be completely  
disabled. The source current, sink current, and  
commutating voltage are all independently set. In addition,  
the load is configurable and may be used as a  
programmable voltage clamp.  
BIAS  
DVH  
RADJ  
DOUT  
FADJ  
DHI  
DHI*  
DVR_EN  
DVR_EN*  
The window comparator spans a 12V common mode  
range, tracks input signals with edge rates greater than 6  
V/ns, and passes sub-ns pulses. An input power down  
mode allows for extremely low leakage measurements.  
DVL  
IPD_D  
QA*  
QA  
CVA  
The inclusion of all pin electronics building blocks into a  
52 lead MQFP (10 mm body w/ internal heat spreader)  
offers a highly integrated solution that is traditionally  
implemented with multiple integrated circuits or discretes.  
PECL  
VINP  
IPD_C  
QB  
CVB  
QB*  
VCC  
1KΩ  
1KΩ  
Applications  
ISC_IN  
BRIDGE_SC  
LOAD  
VCM_IN  
VCM_OUT_A  
VCM_OUT_B  
• VLSI Test Equipment  
• Mixed-Signal Test Equipment  
• Memory Testers (Bidirectional Channels)  
• ASIC Verifiers  
BRIDGE_SK  
ISK_IN  
LD_EN  
LD_EN*  
VEE  
www.semtech.com  
Revision 2 / December 1, 2000  
1

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