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ECM2A4D3A18-32.000M PDF预览

ECM2A4D3A18-32.000M

更新时间: 2024-11-07 14:49:27
品牌 Logo 应用领域
日蚀 - ECLIPTEK 驱动晶体谐振器
页数 文件大小 规格书
4页 121K
描述
QUARTZ CRYSTAL RESONATOR, 32 MHz, ROHS COMPLIANT, CERAMIC, SMD, 4 PIN

ECM2A4D3A18-32.000M 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Obsolete包装说明:ROHS COMPLIANT, CERAMIC, SMD, 4 PIN
Reach Compliance Code:compliantHTS代码:8541.60.00.60
风险等级:5.84Is Samacsys:N
其他特性:AT-CUT CRYSTAL老化:3 PPM/YEAR
晶体/谐振器类型:PARALLEL - FUNDAMENTAL驱动电平:100 µW
频率稳定性:0.002%频率容差:15 ppm
JESD-609代码:e4负载电容:18 pF
安装特点:SURFACE MOUNT标称工作频率:32 MHz
最高工作温度:85 °C最低工作温度:-30 °C
物理尺寸:L2.5XB2.0XH0.55 (mm)/L0.098XB0.079XH0.022 (inch)串联电阻:60 Ω
表面贴装:YES端子面层:Nickel/Gold (Ni/Au)
Base Number Matches:1

ECM2A4D3A18-32.000M 数据手册

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RoHS  
Pb  
ECM2A4D3A18-32.000M  
ECM2A 4 D 3 A 18 -32.000M  
Series  
Nominal Frequency  
32.000MHz  
RoHS Compliant (Pb-free) 2.0mm x 2.5mm 4 Pad  
Ceramic SMD Crystal  
Load Capacitance  
18pF Parallel Resonant  
Frequency Tolerance  
±15ppm Maximum  
Mode of Operation  
AT-Cut Fundamental  
Frequency Stability  
±20ppm Maximum  
Operating Temperature Range  
-30°C to +85°C  
ELECTRICAL SPECIFICATIONS  
Nominal Frequency  
Frequency Tolerance  
Frequency Stability  
Aging at 25°C  
32.000MHz  
±15ppm Maximum  
±20ppm Maximum  
±3ppm/year Maximum  
-30°C to +85°C  
Operating Temperature Range  
Load Capacitance  
18pF Parallel Resonant  
5pF Maximum  
Shunt Capacitance (C0)  
Equivalent Series Resistance  
Mode of Operation  
60 Ohms Maximum  
AT-Cut Fundamental  
100µWatts Maximum  
Drive Level  
Spurious Response  
Storage Temperature Range  
Insulation Resistance  
-3dB Minimum; Fo to Fo +5000ppm  
-40°C to +90°C  
500 Megaohms Minimum at 100Vdc  
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS  
ESD Susceptibility  
MIL-STD-883, Method 3015, Class 1, HBM: 1500V  
MIL-STD-883, Method 1014, Condition A  
UL94-V0  
Fine Leak Test  
Flammability  
Gross Leak Test  
Mechanical Shock  
Moisture Resistance  
Moisture Sensitivity  
Resistance to Soldering Heat  
Resistance to Solvents  
Solderability  
MIL-STD-883, Method 1014, Condition C  
MIL-STD-883, Method 2002, Condition B  
MIL-STD-883, Method 1004  
J-STD-020, MSL 1  
MIL-STD-202, Method 210, Condition K  
MIL-STD-202, Method 215  
MIL-STD-883, Method 2003  
Temperature Cycling  
Vibration  
MIL-STD-883, Method 1010, Condition B  
MIL-STD-883, Method 2007, Condition A  
www.ecliptek.com | Specification Subject to Change Without Notice | Rev B 3/11/2011 | Page 1 of 4  

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