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EC1100HST-25.000M PDF预览

EC1100HST-25.000M

更新时间: 2024-11-05 19:59:03
品牌 Logo 应用领域
日蚀 - ECLIPTEK /
页数 文件大小 规格书
7页 187K
描述
OSCILLATORS 100PPM 0+70 5.0V 4 25.000MHZ NC CMOS HALF 8PIN DIP

EC1100HST-25.000M 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:ActiveReach Compliance Code:unknown
风险等级:5.71Base Number Matches:1

EC1100HST-25.000M 数据手册

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RoHS  
Pb  
EC1100HST-25.000M  
EC11 00 HS  
T
-25.000M  
Series  
Nominal Frequency  
25.000MHz  
RoHS Compliant (Pb-free) 5.0V 8 Pin DIP Metal  
Thru-Hole HCMOS/TTL Oscillator  
Pin 1 Connection  
No Connect  
Frequency Tolerance/Stability  
±100ppm Maximum  
Duty Cycle  
50 ±5(%)  
Package  
Operating Temperature Range  
0°C to +70°C  
ELECTRICAL SPECIFICATIONS  
Nominal Frequency  
25.000MHz  
Frequency Tolerance/Stability  
±100ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the  
Operating Temperature Range, Supply Voltage Change, Output Load Change, First Year Aging at 25°C,  
Shock, and Vibration)  
Aging at 25°C  
±5ppm/year Maximum  
Operating Temperature Range  
Supply Voltage  
0°C to +70°C  
5.0Vdc ±10%  
Input Current  
55mA Maximum  
Output Voltage Logic High (Voh)  
Output Voltage Logic Low (Vol)  
Rise/Fall Time  
2.4Vdc Minimum with TTL Load, Vdd-0.5Vdc Minimum with HCMOS Load  
0.4Vdc Maximum with TTL Load, 0.5Vdc Maximum with HCMOS Load  
6nSec Maximum (Measured at 0.4Vdc to 2.4Vdc with TTL Load; Measured at 20% to 80% of waveform  
with HCMOS Load)  
Duty Cycle  
50 ±5(%) (Measured at 1.4Vdc)  
10TTL Load or 15pF HCMOS Load Maximum  
CMOS  
Load Drive Capability  
Output Logic Type  
Pin 1 Connection  
No Connect  
Tri-State Input Voltage (Vih and Vil)  
+2.2Vdc Minimum to enable output, +0.8Vdc to disable output (High Impedance), No connect to enable  
output.  
Absolute Clock Jitter  
±100pSec Maximum  
±25pSec Maximum  
10mSec Maximum  
-55°C to +125°C  
One Sigma Clock Period Jitter  
Start Up Time  
Storage Temperature Range  
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS  
Fine Leak Test  
MIL-STD-883, Method 1014, Condition A  
MIL-STD-883, Method 1014, Condition C  
MIL-STD-883, Method 2004  
Gross Leak Test  
Lead Integrity  
Mechanical Shock  
Resistance to Soldering Heat  
Resistance to Solvents  
Solderability  
MIL-STD-202, Method 213, Condition C  
MIL-STD-202, Method 210  
MIL-STD-202, Method 215  
MIL-STD-883, Method 2003  
Temperature Cycling  
Vibration  
MIL-STD-883, Method 1010  
MIL-STD-883, Method 2007, Condition A  
www.ecliptek.com | Specification Subject to Change Without Notice | Rev K 2/17/2010 | Page 1 of 7  

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