DS40MB200
www.ti.com
SNLS144I –JUNE 2005–REVISED MARCH 2013
DS40MB200 Dual 4.0 Gbps 2:1/1:2 CML Mux/Buffer with Transmit Pre-Emphasis and
Receive Equalization
Check for Samples: DS40MB200
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FEATURES
DESCRIPTION
The DS40MB200 is a dual signal conditioning 2:1
multiplexer and 1:2 fan-out buffer designed for use in
2
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1– 4 Gbps Low Jitter Operation
Fixed Input Equalization
•
•
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backplane
redundancy
applications.
Signal
Programmable Output Pre-Emphasis
conditioning features include input equalization and
programmable output pre-emphasis that enable data
communication in FR4 backplanes up to 4 Gbps.
Each input stage has a fixed equalizer to reduce ISI
distortion from board traces.
Independent Switch and Line Side Pre-
Emphasis Controls
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•
•
•
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Programmable Switch-Side Loopback Mode
On-Chip Terminations
All output drivers have 4 selectable steps of pre-
emphasis to compensate for transmission losses from
long FR4 backplanes and reduce deterministic jitter.
The pre-emphasis levels can be independently
controlled for the line-side and switch-side drivers.
The internal loopback paths from switch-side input to
switch-side output enable at-speed system testing. All
receiver inputs are internally terminated with 100Ω
differential terminating resistors. All drivers are
+3.3V Supply
ESD Rating HBM 6 kV
Lead-Less WQFN-48 Package (7 mm x 7 mm)
0°C to +85°C Operating Temperature Range
APPLICATIONS
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Backplane or Cable Driver
internally terminated with 50Ω to VCC
.
Redundancy and Signal Conditioning
Applications
•
XAUI
Functional Block Diagram
SIA_0 ±
SIB_0 ±
EQ
EQ
LO_0 ±
PRE_L
MUX_S0
LB0A
Port 0
SOA_0 ±
PRE_S
SOB_0 ±
LB0B
LI_0 ±
EQ
PRE_S
SIA_1 ±
SIB_1 ±
EQ
LO_1 ±
PRE_L
MUX_S1
EQ
LB1A
Port 1
SOA_1 ±
PRE_S
SOB_1 ±
LB1B
LI_1 ±
EQ
PRE_S
PreL_0
PreL_1
V
PRE_L
PRE_S
CC
Pre-emphasis
Control
PreS_0
PreS_1
GND
RSV
All CML inputs and outputs must be AC coupled for optimal performance.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated