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DM54194W/883 PDF预览

DM54194W/883

更新时间: 2024-11-18 20:59:43
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路触发器
页数 文件大小 规格书
4页 14K
描述
TTL/H/L SERIES, 4-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CDFP16

DM54194W/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL16,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.5
其他特性:HOLD MODE; EXTERNAL CLOCK GATED WITH MODE CONTROL AND USED AS SHIFT CLOCK计数方向:BIDIRECTIONAL
系列:TTL/H/LJESD-30 代码:R-GDFP-F16
JESD-609代码:e0长度:9.6645 mm
负载电容(CL):15 pF逻辑集成电路类型:PARALLEL IN PARALLEL OUT
最大频率@ Nom-Sup:25000000 Hz位数:4
功能数量:1端子数量:16
最高工作温度:125 °C最低工作温度:-55 °C
输出极性:TRUE封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DFP封装等效代码:FL16,.3
封装形状:RECTANGULAR封装形式:FLATPACK
电源:5 V最大电源电流(ICC):63 mA
传播延迟(tpd):26 ns认证状态:Not Qualified
筛选级别:38535Q/M;38534H;883B座面最大高度:2.032 mm
子类别:Shift Registers最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:TTL
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:FLAT端子节距:1.27 mm
端子位置:DUAL触发器类型:POSITIVE EDGE
宽度:6.604 mm最小 fmax:25 MHz
Base Number Matches:1

DM54194W/883 数据手册

 浏览型号DM54194W/883的Datasheet PDF文件第2页浏览型号DM54194W/883的Datasheet PDF文件第3页浏览型号DM54194W/883的Datasheet PDF文件第4页 
MILITARY DATA SHEET  
Original Creation Date: 06/04/96  
Last Update Date: 07/30/96  
MNDM54194-X REV 1A0  
Last Major Revision Date: 06/04/96  
4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER  
General Description  
The '194 is a high speed 4-bit bidirectional universal shift register. As a high speed  
multifunctional sequential building block, it is useful in a wide variety of applications.  
It may be used in serial-serial, shift left, shift right, serial-parallel,  
parallel-serial, and parallel-parallel data register transfers. The '194 is similar in  
operation to the '195 universal shift register, with added features of shift left without  
external connections an hold (do nothing) modes of operation.  
Industry Part Number  
NS Part Numbers  
DM54194  
DM54194J/883  
DM54194W/883  
Prime Die  
T194  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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