5秒后页面跳转
DM2200T1-12I PDF预览

DM2200T1-12I

更新时间: 2024-01-30 13:42:11
品牌 Logo 应用领域
铁电 - RAMTRON 动态存储器静态存储器光电二极管内存集成电路
页数 文件大小 规格书
18页 150K
描述
Cache DRAM, 4MX1, 30ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

DM2200T1-12I 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP, TSOP44,.36,32
针数:44Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.02
风险等级:5.92访问模式:FAST PAGE/STATIC COLUMN
最长访问时间:30 ns其他特性:RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH; 2K X 1 SRAM
I/O 类型:SEPARATEJESD-30 代码:R-PDSO-G44
JESD-609代码:e0内存密度:4194304 bit
内存集成电路类型:CACHE DRAM内存宽度:1
功能数量:1端口数量:1
端子数量:44字数:4194304 words
字数代码:4000000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:4MX1输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP
封装等效代码:TSOP44,.36,32封装形状:RECTANGULAR
封装形式:SMALL OUTLINE电源:3.3 V
认证状态:Not Qualified刷新周期:1024
自我刷新:NO最大待机电流:0.001 A
子类别:DRAMs最大压摆率:0.225 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:MOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.8 mm端子位置:DUAL
Base Number Matches:1

DM2200T1-12I 数据手册

 浏览型号DM2200T1-12I的Datasheet PDF文件第1页浏览型号DM2200T1-12I的Datasheet PDF文件第2页浏览型号DM2200T1-12I的Datasheet PDF文件第4页浏览型号DM2200T1-12I的Datasheet PDF文件第5页浏览型号DM2200T1-12I的Datasheet PDF文件第6页浏览型号DM2200T1-12I的Datasheet PDF文件第7页 
cache reads concurrently with precharge. During write sequences, the output pin Q (as shown below). The specific databit selected to  
a write operation is not performed unless both /CAL and /WE are the output is determined by column addresses A and A . System  
9
10  
low. As a result, the /CAL input can be used as a byte write select in operation is consistent with the standard “Functional Description”  
multi-chip systems.  
and timing diagrams shown in this specification. See the note in the  
read timing diagrams and “Switching Characteristics” chart for the  
faster access and data hold times.  
DRAM Write Miss  
If a DRAM write request is initiated by clocking /RE while W/R,  
/CAL, /WE, and /F are high, the EDRAM will compare the new row  
address to the LRR address latch (an 11-bit latch loaded on each  
/RE active read miss cycle). If the row address does not match, the  
EDRAM will write data to the DRAM array only and contents of the  
current cache are not modified. The write address and data are  
posted to the DRAM as soon as the column address is latched by  
bringing /CAL low and the write data is latched by bringing /WE  
low. The write address and data can be latched very quickly after  
the fall of /RE (tRAH + tASC for the column address and tDS for the  
data). During a write burst sequence, the second write data can be  
posted at time tRSW after /RE. Subsequent writes within a page can  
occur with write cycle time tPC. During a write miss sequence,  
cache reads are inhibited and the output buffers are disabled  
(independently of /G) until time tWRR after /RE goes high. At the  
end of a write sequence (after /CAL and /WE are brought high and  
tRE is satisfied), /RE can be brought high to precharge the memory.  
It is possible to perform cache reads concurrently with the  
precharge. During write sequences, a write operation is not  
performed unless both /CAL and /WE are low. As a result, /CAL can  
be used as a byte write select in multi-chip systems.  
Internal Refresh  
If /F is active (low) on the assertion of /RE, an internal refresh  
cycle is executed. This cycle refreshes the row address supplied by  
an internal refresh counter. This counter is incremented at the end  
of the cycle in preparation for the next /F refresh cycle. At least  
1,024 /F cycles must be executed every 64ms. /F refresh cycles can  
be hidden because cache memory can be read under column  
address control throughout the entire /F cycle.  
DM2200 Datapath Architecture  
EDRAM  
Row Address  
4M DRAM Array  
A
0-10  
2,048 Bits  
EDRAM  
2K SRAM Cache  
Column Address  
A
2-10  
128 Bits  
Column Address  
4 to 1  
Output Selector  
/RE Inactive Operation  
A A  
9, 10  
It is possible to read data from the SRAM cache without  
clocking /RE. This option is desirable when the external control  
logic is capable of fast hit/miss comparison. In this case, the  
controller can avoid the time required to perform row/column  
multiplexing on hit cycles. This capability also allows the EDRAM to  
perform cache read operations during precharge and refresh  
cycles to minimize wait states and reduce power. It is only  
necessary to select /S and /G and provide the appropriate column  
address to read data as shown in the table below. The row address  
of the SRAM cache accessed without clocking /RE will be specified  
by the LRR address latch loaded during the last /RE active read  
cycle. To perform a cache read in static column mode, /CAL is held  
high, and the cache contents at the specified column address will  
be valid at time tAC after address is stable. To perform a cache read  
in page mode, /CAL is clocked to latch the column address. The  
cache data is valid at time tAC after the column address is setup to  
/CAL.  
1 Bit  
Q
Low Power Mode  
The EDRAM enters its low power mode when /S is high. In this  
mode, the internal DRAM circuitry is powered down to reduce  
standby current to 1mA.  
Low Power, Self-Refresh Option  
When the low power, self-refresh option is specified when  
ordering the EDRAM, the EDRAM enters this mode when /RE is  
clocked while /S, W/R, /F, and /WE are high; and /CAL is low. In this  
mode, the power is turned off to all I/O pins except /RE to  
minimize chip power, and an on-board refresh clock is enabled to  
perform self-refresh cycles using the on-board refresh counter. The  
EDRAM remains in this low power mode until /RE is brought high  
again to terminate the mode. The EDRAM /RE input must remain  
high for tRP2 following exit from self-refresh mode to allow any on-  
going internal refresh to terminate prior to the next memory  
operation.  
On-Chip SRAM Interleave  
The DM2200 has an on-chip interleave of its SRAM cache  
which allows 8ns random accesses (tAC1) for up to three data  
words (burst reads) following an initial read access (hit or miss).  
The SRAM cache is integrated into the DRAM arrays in a 512 x 4  
organization. It is converted into a 2K x 1 page organization by  
using an on-chip address multiplexer to select one of four bits to  
+3.3 Volt Power Supply Operation  
If the +3.3 volt power supply option is specified, the EDRAM  
will operate from a +3.3 volt ±0.3 volt power supply and all inputs  
and outputs will have LVTTL/LVCMOS compatible signal levels. The  
+3.3 volt EDRAM will not accept input levels which exceed the  
power supply voltage. If mixed I/O levels are expected in your  
system, please specify the +5 volt version of the EDRAM.  
Function  
/S  
L
/G /CAL  
A
0-8  
Cache Read (Static Column)  
Cache Read (Page Mode)  
L
L
H
Column Address  
Column Address  
/CAL Before /RE Refresh (“/CAS Before /RAS)  
/CAL before /RE refresh, a special case of internal refresh, is  
discussed in the “Reduced Pin Count Operation” section below.  
L
H = High; L = Low; X = Don’t Care; = Transitioning  
1-3  

与DM2200T1-12I相关器件

型号 品牌 描述 获取价格 数据表
DM2200T1-12L RAMTRON Cache DRAM, 4MX1, 30ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

获取价格

DM2200T1-15 RAMTRON Cache DRAM, 4MX1, 35ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

获取价格

DM2200T1-15I RAMTRON Cache DRAM, 4MX1, 35ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

获取价格

DM2200T1-15L RAMTRON Cache DRAM, 4MX1, 35ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

获取价格

DM2200T-12 ETC Enhanced DRAM (EDRAM)

获取价格

DM2200T-12I RAMTRON Cache DRAM, 4MX1, 30ns, MOS, PDSO44, 0.300 INCH, PLASTIC, TSOP2-11

获取价格