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DAC8806

更新时间： 2024-11-24 04:38:27
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德州仪器 - TI 转换器
页数 文件大小 规格书
20页 1258K
描述
14-Bit, Parallel Input Multiplying Digital-to-Analog Converter

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SBAS385A–APRIL 2006–REVISED JUNE 2006  
14-Bit, Parallel Input Multiplying Digital-to-Analog Converter  
FEATURES  
APPLICATIONS  
•
•
•
•
Automatic Test Equipment  
Instrumentation  
Digitally Controlled Calibration  
Industrial Control PLCs  
•
•
•
•
•
•
•
±0.5LSB DNL  
±1LSB INL  
14-Bit Monotonic  
Low Noise: 10nV/√Hz  
Low Power: IDD = 2µA  
Analog Power Supply: +2.7V to +5.5V  
DESCRIPTION  
The DAC8806,  
a
multiplying digital-to-analog  
1.66mA Full-Scale Current,  
with VREF = 10V  
converter (DAC), is designed to operate from a  
single 2.7V to 5.5V supply.  
•
•
•
•
•
•
•
Settling Time: 0.5µs  
The applied external reference input voltage VREF  
determines the full-scale output current. An internal  
feedback resistor (RFB  
tracking for the full-scale output when combined with  
an external, current-to-voltage (I/V) precision  
amplifier.  
4-Quadrant Multiplying Reference  
Reference Bandwidth: 8MHz  
Reference Input: ±15V  
)
provides temperature  
Reference Dynamics: –105THD  
SSOP-28 Package  
A
parallel  
interface  
offers  
high-speed  
Industry-Standard Pin Configuration  
communications. The DAC8806 is packaged in a  
space-saving SSOP-28 package and has an  
industry-standard pinout.  
VDD  
R1  
RCOM  
R1  
REF ROFS  
ROFS  
RFB  
RFB  
R2  
DAC8806  
D0  
IOUT  
DAC  
Input  
DAC  
Register  
D13  
Parallel Bus  
Register  
AGND  
DGND  
WR  
RST  
Control  
Logic  
LDAC  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2006, Texas Instruments Incorporated  
 
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