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DAC8811B PDF预览

DAC8811B

更新时间: 2024-11-26 22:50:43
品牌 Logo 应用领域
德州仪器 - TI 转换器
页数 文件大小 规格书
15页 412K
描述
16-Bit, Serial Input Multiplying Digital-to-Analog Converter

DAC8811B 数据手册

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DAC8811  
www.ti.com  
SLAS411ANOVEMBER 2004REVISED DECEMBER 2004  
16-Bit, Serial Input Multiplying Digital-to-Analog Converter  
FEATURES  
DESCRIPTION  
±0.5 LSB DNL  
16-Bit Monotonic  
±1 LSB INL  
The DAC8811 multiplying digital-to-analog converter  
(DAC) is designed to operate from a single 2.7-V to  
5.5-V supply.  
Low Noise: 12 nV/Hz  
Low Power: IDD = 2 µA  
+2.7 V to +5.5 V Analog Power Supply  
2 mA Full-Scale Current ±20%,  
with VREF = 10 V  
The applied external reference input voltage VREF  
determines the full-scale output current. An internal  
feedback resistor (RFB) provides temperature tracking  
for the full-scale output when combined with an  
external I-to-V precision amplifier.  
A serial data interface offers high-speed, three-wire  
microcontroller-compatible inputs using data-in (SDI),  
clock (CLK), and chip-select (CS).  
50-MHz Serial Interface  
0.5 µs Settling Time  
4-Quadrant Multiplying Reference  
Reference Bandwidth: 10 MHz  
±10 V Reference Input  
The DAC8811 is packaged in space-saving 8-lead  
SON and MSOP packages.  
Reference Dynamics: -105 THD  
DAC8811  
R
FB  
V
DD  
Tiny 8-Lead 3 x 3 mm SON and 3 x 5 mm  
MSOP Packages  
D/A  
Converter  
I
V
REF  
OUT  
Industry-Standard Pin Configuration  
16  
APPLICATIONS  
DAC  
Register  
CS  
Automatic Test Equipment  
Instrumentation  
Digitally Controlled Calibration  
Industrial Control PLCs  
16  
Shift  
Register  
CLK  
SDI  
GND  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004, Texas Instruments Incorporated  

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