CYRS15B102Q
Radiation hardened, 2-Mbit Serial (SPI)
F-RAM
Radiation performance
• Radiation data
- Total dose =150 Krad (50 rad(Si)/s)
200 Krad (10 rad(Si)/s)
- Heavy Ion soft error rate immune up to 114LET
- Heavy Ion single event functional interrupt < 1.34 × 10-4 upsets/device-day (GEO - solar min)
- Dose rate = 1.1 × 108 rad(Si)/sec (dynamic)/1.1× 1011 rad(Si)/sec (static)
- Dose rate survivability (rad(Si)/sec) = 1.1 × 1011 rad(Si)/sec
- Latch-up immunity = 114 MeV.cm2/mg (115 °C)
• Prototyping options
- Non-qualified CYPT15B102Q devices with same functional and timing characteristics in a 16-pin ceramic SOP
package
Features
• 2-Mbit ferroelectric random access memory (F-RAM) logically organized as 256K × 8
- High-endurance 10 trillion (1013) read/writes
- 121-year data retention at 85 °C(See Data retention and endurance on page 22)
- NoDelay™ writes
• Fast serial peripheral interface (SPI)
- Up to 25-MHz frequency
- Direct hardware replacement for serial flash and EEPROM
• Sophisticated write protection scheme
- Hardware protection using the write protect (WP) pin
- Software protection using write disable instruction
- Software block protection for 1/4, 1/2, or entire array
• Device ID
- Manufacturer ID and product ID
• Low power consumption (pre-/post 150krad TID radiation)
- 10-mA/10-mA active current at 25 MHz
- 850-A/5-mA standby current
- 25-A/8mA sleep mode current
• Low-voltage operation: VDD = 2.0 V to 3.6 V
• Military temperature: –55 °C to +125 °C
• 16-pin ceramic SOP package
Datasheet
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Please read the Important Notice and Warnings at the end of this document
page 1 of 31
002-19045 Rev. *E
2021-12-10