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CY7C1625KV18-250BZXI PDF预览

CY7C1625KV18-250BZXI

更新时间: 2024-01-01 03:29:03
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 时钟静态存储器内存集成电路
页数 文件大小 规格书
33页 626K
描述
QDR SRAM, 16MX9, 0.45ns, CMOS, PBGA165, FBGA-165

CY7C1625KV18-250BZXI 技术参数

是否Rohs认证: 符合生命周期:Active
零件包装代码:BGA包装说明:LBGA, BGA165,11X15,40
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
Factory Lead Time:1 week风险等级:2.14
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):250 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:17 mm内存密度:150994944 bit
内存集成电路类型:QDR SRAM内存宽度:9
功能数量:1端子数量:165
字数:16777216 words字数代码:16000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:16MX9
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):260
电源:1.5/1.8,1.8 V认证状态:Not Qualified
座面最大高度:1.4 mm最大待机电流:0.37 A
最小待机电流:1.7 V子类别:SRAMs
最大压摆率:0.78 mA最大供电电压 (Vsup):1.9 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Tin/Silver/Copper (Sn/Ag/Cu)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:40
宽度:15 mmBase Number Matches:1

CY7C1625KV18-250BZXI 数据手册

 浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第2页浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第3页浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第4页浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第5页浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第6页浏览型号CY7C1625KV18-250BZXI的Datasheet PDF文件第7页 
CY7C1625KV18  
CY7C1612KV18  
CY7C1614KV18  
144-Mbit QDR® II SRAM Two-Word  
Burst Architecture  
144-Mbit QDR® II SRAM Two-Word Burst Architecture  
Features  
Configurations  
Separate independent read and write data ports  
Supports concurrent transactions  
CY7C1625KV18 – 16 M × 9  
CY7C1612KV18 – 8 M × 18  
CY7C1614KV18 – 4 M × 36  
360-MHz clock for high bandwidth  
Two-word burst on all accesses  
Functional Description  
Double data rate (DDR) interfaces on both read and write ports  
The CY7C1625KV18, CY7C1612KV18, and CY7C1614KV18  
are 1.8-V synchronous pipelined SRAMs, equipped with QDR II  
architecture. QDR II architecture consists of two separate ports:  
the read port and the write port to access the memory array. The  
read port has dedicated data outputs to support read operations  
and the write port has dedicated data inputs to support write  
operations. QDR II architecture has separate data inputs and  
data outputs to completely eliminate the need to ‘turn around’ the  
data bus that exists with common I/O devices. Access to each  
port is through a common address bus. Addresses for read and  
write addresses are latched on alternate rising edges of the input  
(K) clock. Accesses to the QDR II read and write ports are  
completely independent of one another. To maximize data  
throughput, both read and write ports are equipped with DDR  
interfaces. Each address location is associated with two 9-bit  
words (CY7C1625KV18), 18-bit words (CY7C1612KV18), or  
36-bit words (CY7C1614KV18) that burst sequentially into or out  
of the device. Because data can be transferred into and out of  
the device on every rising edge of both input clocks (K and K and  
C and C), memory bandwidth is maximized while simplifying  
system design by eliminating bus turnarounds.  
(data transferred at 720 MHz) at 360 MHz  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize clock  
skew and flight time mismatches  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Single multiplexed address input bus latches address inputs  
for both read and write ports  
Separate port selects for depth expansion  
Synchronous internally self-timed writes  
Quad data rate (QDR®) II operates with 1.5-cycle read latency  
when DOFF is asserted high  
OperatessimilartoQDRIdevicewith1cyclereadlatencywhen  
DOFF is asserted low  
Available in × 9, × 18, and × 36 configurations  
Full data coherency, providing most current data  
Depth expansion is accomplished with port selects, which  
enables each port to operate independently.  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
Core VDD = 1.8 V (± 0.1 V); I/O VDDQ = 1.4 V to VDD  
Supports both 1.5 V and 1.8 V I/O supply  
Available in 165-ball fine-pitch ball grid array (FBGA) package  
(15 ×17 ×1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
For a complete list of related documentation, click here.  
Variable drive high-speed transceiver logic (HSTL) output  
buffers  
JTAG 1149.1 compatible test access port  
Phase Locked Loop (PLL) for accurate data placement  
Selection Guide  
Description  
Maximum operating frequency  
360 MHz  
360  
333 MHz  
333  
300 MHz  
300  
250 MHz Unit  
250  
780  
800  
950  
MHz  
mA  
Maximum operating current  
× 9 Not Offered  
950  
880  
× 18  
1025  
970  
910  
× 36 Not Offered  
1160  
1080  
Cypress Semiconductor Corporation  
Document Number: 001-16238 Rev. *N  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 4, 2016  
 
 
 
 

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