CY7C1565KV18
72-Mbit QDR® II+ SRAM Four-Word
Burst Architecture (2.5 Cycle Read Latency)
72-QDR® II+ SRAM Four-Word Burst Architecture (2.5 Cycle Read Latency)
Features
Configurations
■ Separate independent read and write data ports
❐ Supports concurrent transactions
With Read Cycle Latency of 2.5 cycles
CY7C1565KV18: 2M × 36
■ 550-MHz clock for high bandwidth
Functional Description
■ Four-word burst for reducing address bus frequency
The CY7C1565KV18 is1.8-V synchronous pipelined SRAM,
equipped with QDR II+ architecture. Similar to QDR II
architecture, QDR II+ architecture consists of two separate ports:
the read port and the write port to access the memory array. The
read port has dedicated data outputs to support read operations
and the write port has dedicated data inputs to support write
operations. QDR II+ architecture has separate data inputs and
data outputs to completely eliminate the need to “turnaround” the
data bus that exists with common I/O devices. Each port is
accessed through a common address bus. Addresses for read
and write addresses are latched on alternate rising edges of the
input (K) clock. Accesses to the QDR II+ read and write ports are
completely independent of one another. To maximize data
throughput, both read and write ports are equipped with DDR
interfaces. Each address location is associated with four 36-bit
words (CY7C1565KV18) that burst sequentially into or out of the
device. Because data is transferred into and out of the device on
every rising edge of both input clocks (K and K), memory
bandwidth is maximized while simplifying system design by
eliminating bus “turnarounds”.
■ Double data rate (DDR) Interfaces on both read and write ports
(data transferred at 1100 MHz) at 550 MHz
■ Available in 2.5-clock cycle latency
■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■ Echo clocks (CQ and CQ) simplify data capture in high speed
systems
■ Data valid pin (QVLD) to indicate valid data on the output
■ Single multiplexed address input bus latches address inputs
for read and write ports
■ Separate port selects for depth expansion
■ Synchronous internally self-timed writes
■ Quaddatarate(QDR®)II+operateswith2.5-cyclereadlatency
when DOFF is asserted HIGH
■ Operates similar to QDR I device with one cycle read latency
when DOFF is asserted LOW
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
■ Available in × 36 configurations
■ Full data coherency, providing most current data
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the K or K input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
[1]
■ Core VDD = 1.8 V± 0.1 V; I/O VDDQ = 1.4 V to VDD
❐ Supports both 1.5 V and 1.8 V I/O supply
■ High-speed transceiver logic (HSTL) inputs and variable drive
HSTL output buffers
For a complete list of related documentation, click here.
■ Available in 165-ball fine pitch ball grid array (FBGA) package
(13 ×15 ×1.4 mm)
■ Offered in both Pb-free and non Pb-free packages
■ JTAG 1149.1 compatible test access port
■ Phase-locked loop (PLL) for accurate data placement
Selection Guide
Description
550 MHz
550
500 MHz
500
450 MHz
450
400 MHz Unit
Maximum operating frequency
Maximum operating current
400
MHz
mA
× 36
1310
1210
1100
1000
Note
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V
= 1.4 V to V
.
DD
DDQ
Cypress Semiconductor Corporation
Document Number: 001-15878 Rev. *S
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 30, 2017