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CY7C1527JV18-300BZXC PDF预览

CY7C1527JV18-300BZXC

更新时间: 2024-11-23 03:09:07
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器双倍数据速率时钟
页数 文件大小 规格书
26页 630K
描述
72-Mbit DDR-II SRAM 2-Word Burst Architecture

CY7C1527JV18-300BZXC 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:BGA包装说明:LBGA, BGA165,11X15,40
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.84Is Samacsys:N
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):300 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:17 mm内存密度:75497472 bit
内存集成电路类型:DDR SRAM内存宽度:9
湿度敏感等级:3功能数量:1
端子数量:165字数:8388608 words
字数代码:8000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:8MX9输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.41 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:1.035 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:40宽度:15 mm
Base Number Matches:1

CY7C1527JV18-300BZXC 数据手册

 浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第2页浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第3页浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第4页浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第5页浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第6页浏览型号CY7C1527JV18-300BZXC的Datasheet PDF文件第7页 
CY7C1516JV18, CY7C1527JV18  
CY7C1518JV18, CY7C1520JV18  
72-Mbit DDR-II SRAM 2-Word  
Burst Architecture  
Features  
Functional Description  
72-Mbit density (8M x 8, 8M x 9, 4M x 18, 2M x 36)  
300 MHz clock for high bandwidth  
The CY7C1516JV18, CY7C1527JV18, CY7C1518JV18, and  
CY7C1520JV18 are 1.8V Synchronous Pipelined SRAM  
equipped with DDR-II architecture. The DDR-II consists of an  
SRAM core with advanced synchronous peripheral circuitry and  
a 1-bit burst counter. Addresses for read and write are latched  
on alternate rising edges of the input (K) clock. Write data is  
registered on the rising edges of both K and K. Read data is  
driven on the rising edges of C and C if provided, or on the rising  
edge of K and K if C/C are not provided. Each address location  
is associated with two 8-bit words in the case of CY7C1516JV18  
and two 9-bit words in the case of CY7C1527JV18 that burst  
sequentially into or out of the device. The burst counter always  
starts with a “0” internally in the case of CY7C1516JV18 and  
CY7C1527JV18. On CY7C1518JV18 and CY7C1520JV18, the  
burst counter takes in the least significant bit of the external  
address and bursts two 18-bit words in the case of  
CY7C1518JV18 and two 36-bit words in the case of  
CY7C1520JV18 sequentially into or out of the device.  
2-word burst for reducing address bus frequency  
Double Data Rate (DDR) interfaces  
(data transferred at 600 MHz) at 300 MHz  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize clock  
skew and flight time mismatches  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Synchronous internally self-timed writes  
DDR-II operates with 1.5 cycle read latency when Delay Lock  
Loop (DLL) is enabled  
Asynchronous inputs include an output impedance matching  
input (ZQ). Synchronous data outputs (Q, sharing the same  
physical pins as the data inputs D) are tightly matched to the two  
output echo clocks CQ/CQ, eliminating the need for separately  
capturing data from each individual DDR SRAM in the system  
design. Output data clocks (C/C) enable maximum system  
clocking and data synchronization flexibility.  
Operates like a DDR-I device with 1 cycle read latency in DLL  
off mode  
1.8V core power supply with HSTL inputs and outputs  
Variable drive HSTL output buffers  
Expanded HSTL output voltage (1.4V–VDD  
)
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
JTAG 1149.1 compatible test access port  
Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1516JV18 – 8M x 8  
CY7C1527JV18 – 8M x 9  
CY7C1518JV18 – 4M x 18  
CY7C1520JV18 – 2M x 36  
Selection Guide  
Description  
Maximum Operating Frequency  
300 MHz  
300  
Unit  
MHz  
mA  
Maximum Operating Current  
x8  
x9  
1035  
1035  
1045  
1055  
x18  
x36  
Cypress Semiconductor Corporation  
Document Number: 001-12559 Rev. *C  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised March 10, 2008  
[+] Feedback  

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