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CY7C1411BV18-278BZI PDF预览

CY7C1411BV18-278BZI

更新时间: 2024-11-27 05:19:27
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
30页 706K
描述
36-Mbit QDR⑩-II SRAM 4-Word Burst Architecture

CY7C1411BV18-278BZI 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:15 X 17 MM, 1.40 MM HEIGHT, M0-216, FBGA-165
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.88最长访问时间:0.45 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):278 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:17 mm
内存密度:33554432 bit内存集成电路类型:QDR SRAM
内存宽度:8功能数量:1
端子数量:165字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:4MX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):225电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.355 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.815 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD SILVER端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:30宽度:15 mm
Base Number Matches:1

CY7C1411BV18-278BZI 数据手册

 浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第2页浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第3页浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第4页浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第5页浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第6页浏览型号CY7C1411BV18-278BZI的Datasheet PDF文件第7页 
CY7C1411BV18, CY7C1426BV18  
CY7C1413BV18, CY7C1415BV18  
36-Mbit QDR™-II SRAM 4-Word  
Burst Architecture  
Features  
Configurations  
Separate independent read and write data ports  
Supports concurrent transactions  
CY7C1411BV18 – 4M x 8  
CY7C1426BV18 – 4M x 9  
CY7C1413BV18 – 2M x 18  
CY7C1415BV18 – 1M x 36  
300 MHz clock for high bandwidth  
4-word burst for reducing address bus frequency  
Functional Description  
DoubleDataRate(DDR)interfacesonbothreadandwriteports  
(data transferred at 600 MHz) at 300 MHz  
The CY7C1411BV18, CY7C1426BV18, CY7C1413BV18, and  
CY7C1415BV18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR™-II architecture. QDR-II architecture  
consists of two separate ports to access the memory array. The  
read port has dedicated data outputs to support the read opera-  
tions and the write port has dedicated data inputs to support the  
write operations. QDR-II architecture has separate data inputs  
and data outputs to completely eliminate the need to  
“turn-around” the data bus required with common IO devices.  
Access to each port is through a common address bus.  
Addresses for read and write addresses are latched on alternate  
rising edges of the input (K) clock. Accesses to the QDR-II read  
and write ports are completely independent of one another. To  
maximize data throughput, read and write ports are equipped  
with DDR interfaces. Each address location is associated with  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize clock  
skew and flight time mismatches  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Single multiplexed address input bus latches address inputs  
for both read and write ports  
Separate port selects for depth expansion  
Synchronous internally self-timed writes  
QDR-II operates with 1.5 cycle read latency when DLL is  
enabled  
four  
8-bit  
words  
(CY7C1411BV18),  
9-bit  
words  
Operates as a QDR-I device with 1 cycle read latency in DLL  
off mode  
(CY7C1426BV18), 18-bit words (CY7C1413BV18), or 36-bit  
words (CY7C1415BV18) that burst sequentially into or out of the  
device. Because data can be transferred into and out of the  
device on every rising edge of both input clocks (K and K and C  
and C), memory bandwidth is maximized while simplifying  
system design by eliminating bus “turn-arounds.”  
Available in x 8, x 9, x 18, and x 36 configurations  
Full data coherency, providing most current data  
Core VDD = 1.8 (±0.1V); IO VDDQ = 1.4V to VDD  
Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
Variable drive HSTL output buffers  
Depth expansion is accomplished with port selects, which  
enables each port to operate independently.  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on chip  
synchronous self-timed write circuitry.  
JTAG 1149.1 compatible test access port  
Delay Lock Loop (DLL) for accurate data placement  
Selection Guide  
Description  
300 MHz  
300  
278 MHz  
278  
250 MHz  
250  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
x8  
x9  
930  
865  
790  
655  
570  
940  
870  
795  
660  
575  
x18  
x36  
1020  
1230  
950  
865  
715  
615  
1140  
1040  
850  
725  
Cypress Semiconductor Corporation  
Document Number: 001-07037 Rev. *C  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised September 27, 2007  
[+] Feedback  

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