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CD54ACT157H PDF预览

CD54ACT157H

更新时间: 2024-11-29 21:13:27
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路
页数 文件大小 规格书
10页 134K
描述
ACT SERIES, QUAD 2 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, UUC, DIE

CD54ACT157H 技术参数

生命周期:Obsolete零件包装代码:DIE
包装说明:,Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.84
系列:ACTJESD-30 代码:X-XUUC-N
逻辑集成电路类型:MULTIPLEXER功能数量:4
输入次数:2输出次数:1
最高工作温度:125 °C最低工作温度:-55 °C
输出极性:TRUE封装主体材料:UNSPECIFIED
封装形状:UNSPECIFIED封装形式:UNCASED CHIP
传播延迟(tpd):9.5 ns认证状态:Not Qualified
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:NO LEAD端子位置:UPPER
Base Number Matches:1

CD54ACT157H 数据手册

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OBSOLETE  
54AC157, 54ACT157  
www.ti.com  
SNOS089B JULY 1998REVISED APRIL 2013  
54ACT157 • 54AC157 Quad 2-Input Multiplexer  
Check for Samples: 54AC157, 54ACT157  
1
FEATURES  
DESCRIPTION  
The 'AC/'ACT157 is a high-speed quad 2-input  
23  
ICC and IOZ Reduced by 50%  
multiplexer. Four bits of data from two sources can be  
selected using the common Select and Enable inputs.  
The four outputs present the selected data in the true  
(noninverted) form. The 'AC/'ACT157 can also be  
used as a function generator.  
Outputs Source/Sink 24 mA  
'ACT157 has TTL-Compatible Inputs  
Standard Microcircuit Drawing (SMD)  
'AC157: 5962-89539  
'ACT157: 5962-89688  
Logic Symbols  
Figure 1.  
Figure 2. IEEE/IEC  
Pin Names  
Description  
I0a–I0d  
I1a–I1d  
E
Source 0 Data Inputs  
Source 1 Data Inputs  
Enable Input  
Select Input  
S
Za–Zd  
Outputs  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
FACT is a registered trademark of Fairchild Semiconductor.  
2
3
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 1998–2013, Texas Instruments Incorporated  

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