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CAT24C01BZA-1.8 PDF预览

CAT24C01BZA-1.8

更新时间: 2024-11-07 03:28:07
品牌 Logo 应用领域
CATALYST 可编程只读存储器电动程控只读存储器电可擦编程只读存储器光电二极管
页数 文件大小 规格书
8页 431K
描述
EEPROM, 128X8, Serial, CMOS, PDSO8, LEAD AND HALOGEN FREE, MSOP-8

CAT24C01BZA-1.8 数据手册

 浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第2页浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第3页浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第4页浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第5页浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第6页浏览型号CAT24C01BZA-1.8的Datasheet PDF文件第7页 
CAT24C01B  
K-Bit Serial EEPROM  
FEATURES  
I 1,000,000 Program/Erase Cycles  
I 100 Year Data Retention  
I 2-Wire Serial Interface  
I 1.8 to 6.0Volt Operation  
I 8-pin DIP, 8-pin SOIC, 8 pin TSSOP or 8-pin MSOP  
I Low Power CMOS Technology  
I 4-Byte Page Write Buffer  
I Commercial, Industrial and Automotive  
Temperature Ranges  
I Self-Timed Write Cycle with Auto-Clear  
I "Green" Package Options Available  
DESCRIPTION  
4-byte page write buffer. The device operates via a 2-  
wire serial interface and is available in 8-pin DIP, 8-pin  
SOIC, 8-pin TSSOP or 8-pin MSOP.  
The CAT24C01B is a 1K-bit Serial CMOS EEPROM  
internallyorganizedas128wordsof8bitseach.Catalyst’s  
advanced CMOS technology substantially reduces de-  
vice power requirements. The CAT24C01B features a  
PIN CONFIGURATION  
BLOCK DIAGRAM  
SOIC Package (J, W, GW)  
DIP Package (P, L, GL)  
EXTERNAL LOAD  
1
2
3
4
8
7
6
5
1
2
3
4
8
7
6
5
V
NC  
NC  
NC  
SENSE AMPS  
SHIFT REGISTERS  
CC  
NC  
NC  
NC  
V
CC  
TEST  
D
OUT  
TEST  
ACK  
SCL  
SCL  
V
V
CC  
V
SDA  
V
SS  
SS  
SDA  
WORD ADDRESS  
BUFFERS  
COLUMN  
DECODERS  
SS  
START/STOP  
SDA  
LOGIC  
MSOP Package (R, Z, GZ)  
TSSOP Package (U, Y, GY)  
1
2
3
4
8
7
6
5
V
1
2
3
4
8
7
6
5
NC  
NC  
NC  
CC  
NC  
NC  
NC  
V
CC  
TEST  
XDEC  
EEPROM  
TEST  
SCL  
CONTROL  
LOGIC  
SCL  
V
SDA  
V
SS  
SS  
SDA  
DATA IN STORAGE  
PIN FUNCTIONS  
Pin Name  
Function  
HIGH VOLTAGE/  
TIMING CONTROL  
NC  
No Connect  
SDA  
SCL  
VCC  
VSS  
Serial Data/Address  
Serial Clock  
SCL  
STATE COUNTERS  
+1.8V to +6.0V Power Supply  
Ground  
TEST  
Test Input (GND, VCC or  
Floating)  
© 2005 by Catalyst Semiconductor, Inc.  
Characteristics subject to change without notice  
Doc. No. 1081, Rev. E  
1

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