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BUF18830AIRGFTR PDF预览

BUF18830AIRGFTR

更新时间: 2024-09-25 13:05:59
品牌 Logo 应用领域
德州仪器 - TI 电压发生器
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9页 409K
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BUF18830AIRGFTR 数据手册

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BUF18830  
www.ti.com  
SBOS408A MAY 2011REVISED JUNE 2011  
Programmable GAMMA-VOLTAGE GENERATOR  
with Two High Slew Rate V s  
COM  
Check for Samples: BUF18830  
1
FEATURES  
DESCRIPTION  
The BUF18830 offers 18 programmable gamma  
channels and two programmable VCOM channels.  
2
10-BIT RESOLUTION  
18-CHANNEL P-GAMMA:  
All gamma and VCOM channels offer a rail-to-rail  
output that typically swings to within 300 mV of either  
supply rail with a 10-mA load. All channels are  
programmed using a two-wire interface that supports  
standard operations up to 400 kHz and high-speed  
data transfers up to 3.4 MHz.  
300-mV Min Swing-to-Rail (10 mA)  
TWO-CHANNEL P-VCOM  
400-mA Typical IOUT  
:
HIGH SLEW RATE VCOM: 45 V/μs  
RAIL-TO-RAIL OUTPUT  
LOW SUPPLY CURRENT  
SUPPLY VOLTAGE: 6.5 V to 20 V  
DIGITAL SUPPLY: 2.0 V to 5.5 V  
TWO-WIRE INTERFACE: Supports 400 kHz and  
3.4 MHz  
The BUF18830 is manufactured using Texas  
Instrumentsproprietary, state-of-the-art, high-voltage  
CMOS process. This process offers very dense logic  
and high supply voltage operation of up to 20 V. The  
BUF18830 is offered in a QFN-38 package and is  
specified from 40°C to +85°C.  
APPLICATIONS  
TFT-LCD AND OLED REFERENCE DRIVERS  
BUF18830  
VS  
VSD  
DAC  
OUT0  
DAC  
OUT1  
DAC  
DAC  
OUT16  
OUT17  
GNDA  
A0  
Control  
I/F  
SDA  
SCL  
VS-VCOM  
DAC  
DAC  
VCOM-OUT1  
VCOM-Feedback1  
VCOM-OUT2  
GNDD  
VCOM-Feedback2  
GND-VCOM  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011, Texas Instruments Incorporated  

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