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AS7C4096A-10TCN PDF预览

AS7C4096A-10TCN

更新时间: 2024-01-06 22:52:10
品牌 Logo 应用领域
ALSC 存储内存集成电路静态存储器光电二极管
页数 文件大小 规格书
10页 325K
描述
5.0V 512K x 8 CMOS SRAM

AS7C4096A-10TCN 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:TSOP2
包装说明:TSOP2, TSOP44,.46,32针数:44
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.47
最长访问时间:10 nsI/O 类型:COMMON
JESD-30 代码:R-PDSO-G44JESD-609代码:e3/e6
长度:18.415 mm内存密度:4194304 bit
内存集成电路类型:STANDARD SRAM内存宽度:8
功能数量:1端子数量:44
字数:524288 words字数代码:512000
工作模式:ASYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:512KX8
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2封装等效代码:TSOP44,.46,32
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):260
电源:5 V认证状态:Not Qualified
座面最大高度:1.2 mm最大待机电流:0.01 A
最小待机电流:4.5 V子类别:SRAMs
最大压摆率:0.16 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:MATTE TIN/TIN BISMUTH
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUAL处于峰值回流温度下的最长时间:40
宽度:10.16 mmBase Number Matches:1

AS7C4096A-10TCN 数据手册

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AS7C4096A  
®
Write waveform 2 (CE controlled)9  
tWC  
tWR  
tAH  
tAW  
Address  
tAS  
tCW  
CE  
tWP  
WE  
DIN  
tDW  
Data valid  
tDH  
AC test conditions  
- Output load: see Figure B.  
- Input pulse level: GND to V - 0.5V. See Figures A and B.  
CC  
- Input rise and fall times: 2 ns. See Figure A.  
- Input and output timing reference levels: 1.5V.  
+5.0V  
Thevenin equivalent:  
168  
480  
V
- 0.5V  
GND  
DOUT  
255  
CC  
90%  
10%  
90%  
10%  
+1.728V  
DOUT  
C10  
2 ns  
Figure A: Input pulse  
GND  
Figure B: 5.0V Output load  
Notes  
1
2
3
4
5
6
7
8
9
During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.  
For test conditions, see AC Test Conditions.  
tCLZ and tCHZ are specified with CL = 5pF as in Figure B. Transition is measured ±500 mV from steady-state voltage.  
This parameter is guaranteed, but not tested.  
WE is HIGH for read cycle.  
CE and OE are LOW for read cycle.  
Address valid prior to or coincident with CE transition Low.  
All read cycle timings are referenced from the last valid address to the first transitioning address.  
All write cycle timings are referenced from the last valid address to the first transitioning address.  
10 C = 30pF, except at high Z and low Z parameters, where C = 5pF.  
5/27/05, v. 1.1  
Alliance Semiconductor  
P. 6 of 10  

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