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AS7C3364PFD32B-200TQI PDF预览

AS7C3364PFD32B-200TQI

更新时间: 2024-11-25 20:18:27
品牌 Logo 应用领域
美国芯成 - ISSI 静态存储器内存集成电路
页数 文件大小 规格书
19页 549K
描述
Standard SRAM, 64KX32, 3ns, CMOS, PQFP100, 14 X 20 MM, TQFP-100

AS7C3364PFD32B-200TQI 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:QFP
包装说明:LQFP,针数:100
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.53
最长访问时间:3 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PQFP-G100JESD-609代码:e0
长度:20 mm内存密度:2097152 bit
内存集成电路类型:STANDARD SRAM内存宽度:32
功能数量:1端子数量:100
字数:65536 words字数代码:64000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:64KX32
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.6 mm
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:14 mm
Base Number Matches:1

AS7C3364PFD32B-200TQI 数据手册

 浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第2页浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第3页浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第4页浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第5页浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第6页浏览型号AS7C3364PFD32B-200TQI的Datasheet PDF文件第7页 
February 2005  
AS7C3364PFD32B  
AS7C3364PFD36B  
®
3.3V 64K X 32/36 pipeline burst synchronous SRAM  
Features  
• Linear or interleaved burst control  
• Organization: 65,536 words × 32 or 36 bits  
• Fast clock speeds to 200 MHz  
• Fast clock to data access: 3.0/3.5/4.0 ns  
• Fast OE access time: 3.0/3.5/4.0 ns  
• Fully synchronous register-to-register operation  
• Double-cycle deselect  
• Individual byte write and global write  
• Snooze mode for reduced power-standby  
• Common data inputs and data outputs  
• Multiple chip enables for easy expansion  
• 3.3V core power supply  
• 2.5V or 3.3V I/O operation with separate V  
DDQ  
• Asynchronous output enable control  
• Available in 100-pin TQFP package  
Logic block diagram  
LBO  
CLK  
ADV  
ADSC  
ADSP  
CLK  
CE  
CLR  
Burst logic  
64K × 32/36  
Memory  
array  
16  
14  
16  
16  
D
CE  
CLK  
Q
A[15:0]  
Address  
register  
36/32  
36/32  
GWE  
BWE  
d
D
Q
Q
Q
Q
DQ  
d
Byte write  
BW  
registers  
CLK  
D
DQ  
c
BW  
c
Byte write  
registers  
CLK  
D
DQ  
b
BW  
b
Byte write  
registers  
CLK  
D
DQ  
a
4
BW  
a
Byte write  
registers  
CLK  
D
CE0  
CE1  
CE2  
OE  
Output  
registers  
CLK  
Q
Q
Input  
registers  
CLK  
Enable  
register  
CE  
CLK  
D
Enable  
delay  
register  
CLK  
Power  
down  
ZZ  
36/32  
DQ [a:d]  
OE  
Selection guide  
–200  
–166  
–133  
7.5  
133  
4
Units  
Minimum cycle time  
5
6
ns  
MHz  
ns  
Maximum clock frequency  
Maximum clock access time  
Maximum operating current  
Maximum standby current  
200  
3.0  
375  
130  
30  
166  
3.5  
350  
100  
30  
325  
90  
mA  
mA  
mA  
Maximum CMOS standby current (DC)  
30  
1/31/05; v.1.1  
Alliance Semiconductor  
P. 1 of 19  
Copyright © Alliance Semiconductor. All rights reserved.  

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