Static Characteristics
T = 25°C unless otherwise specified
J
APT63H60B2_L
Parameter
Test Conditions
Min
Typ
Max
Unit
V
Symbol
VBR(DSS)
V
= 0V, I = 250µA
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature Coefficient
Drain-Source On Resistance 3
Gate-Source Threshold Voltage
Threshold Voltage Temperature Coefficient
600
GS
D
∆VBR(DSS)/∆TJ
Reference to 25°C, I = 250µA
D
V/°C
Ω
0.57
0.091
4
V
= 10V, I = 33A
D
RDS(on)
VGS(th)
0.11
5
GS
V
3
V
= VDS, I = 2.5mA
D
GS
∆VGS(th)/∆TJ
mV/°C
-10
V
= 600V
= 0V
T = 25°C
J
100
1000
±100
DS
IDSS
IGSS
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
µA
nA
V
T = 125°C
J
GS
V
= ±30V
GS
Dynamic Characteristics
T = 25°C unless otherwise specified
J
Symbol
Parameter
Test Conditions
Min
Typ
65
Max
Unit
gfs
V
= 50V, I = 33A
S
Forward Transconductance
Input Capacitance
DS
D
Ciss
Crss
Coss
13190
135
V
= 0V, V = 25V
DS
GS
Reverse Transfer Capacitance
Output Capacitance
f = 1MHz
1210
pF
4
Co(cr)
Effective Output Capacitance, Charge Related
Effective Output Capacitance, Energy Related
645
335
V
= 0V, V = 0V to 400V
DS
GS
5
Co(er)
Qg
Qgs
Qgd
td(on)
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
330
70
V
= 0 to 10V, I = 33A,
GS
D
nC
ns
V
= 300V
DS
140
75
Resistive Switching
V = 400V, I = 33A
DD
tr
td(off)
tf
85
D
R
= 2.2Ω 6 , V
= 15V
GG
225
70
G
Source-Drain Diode Characteristics
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
Continuous Source Current
(Body Diode)
D
S
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
IS
63
A
G
Pulsed Source Current
(Body Diode) 1
ISM
VSD
trr
245
I
= 33A, T = 25°C, V
= 0V
Diode Forward Voltage
1.0
250
460
V
SD
J
GS
T = 25°C
J
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Peak Recovery dv/dt
ns
T = 125°C
J
3
I
= 33A
T = 25°C
J
1.27
3.32
9.1
SD
Qrr
µC
A
diSD/dt = 100A/µs
= 100V
T = 125°C
J
V
T = 25°C
J
DD
Irrm
T = 125°C
J
13.5
I
≤ 33A, di/dt ≤1000A/µs, V = 400V,
DD
SD
dv/dt
V/ns
30
T = 125°C
J
1
2
3
Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
Starting at TJ = 25°C, L = 3.39mH, RG = 2.2Ω, IAS = 33A.
Pulse test: Pulse Width < 380µs, duty cycle < 2%.
4
5
Co(cr) is defined as a fixed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
Co(er) is defined as a fixed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(er) for any value of
VDS less than V(BR)DSS, use this equation: Co(er) = -1.28E-7/VDS^2 + 5.36E-8/VDS + 2.00E-10.
6
RG is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifications and information contained herein.