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AN273

更新时间： 2022-04-23 23:00:11

品牌	Logo	应用领域
芯科 - SILICON		测试
页数	文件大小	规格书
8页	214K
描述
GR-909 TESTING WITH THE Si321X PROSLIC㈢

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AN273 数据手册

AN273

If R is not installed, a resistive fault present between TIP and RING will provide enough loop current to cause the

voltage on the TIP lead to drop. Since all of the loop current passes through the resistive fault, R , the equation

for R becomes as follows:

R_ST( V_RING– V_TIP

)

--------------------------------------------------------

R_TR

1.5 + V_TIP

Equation 5.

4.3. Condition 3: TIP to GND Fault

Resistive faults from TIP to GND are also detected in the TIP-OPEN linefeed state. In this case, the resistive fault

from TIP to GND (R ) reduces the longitudinal current through R (see Figure 4); thus, a more positive voltage is

present at the TIP terminal. Equation 6 describes R as a function of the TIP and RING voltages. Note that the

denominator is the same as in the R calculation; so, the same critical voltage applies.

1.5 V

TIP

R_ST

R_SH

R_TG

V_OC

R_SR

RING

Figure 4. TIP-OPEN Linefeed State with TIP to GND Resistive Fault

From the voltages measured at TIP and RING, the resistive fault from TIP to GND may be expressed as follows:

– V_TIP× R_ST× R_SH

-------------------------------------------------------------------------------------------------------------

R_TG

R_SH(1.5 + V_TIP) – R_ST( V_RING– V_TIP

)

Equation 6.

If R

is not installed, a gross measurement of the impedance from TIP-GND may be made in the FORWARD

ACTIVE linefeed state. By applying a high common-mode voltage to TIP and keeping the differential voltage to 0 V

(V = 0), a resistive fault will form a voltage divider along with the 160 Ω output impedance of the TIP lead in the

FORWARD ACTIVE state (see Figure 5).

Rev. 0.1

1 2 3 456 7 8

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