Datasheet > AN273

AN273

更新时间： 2022-04-23 23:00:11

品牌	Logo	应用领域
芯科 - SILICON		测试
页数	文件大小	规格书
8页	214K
描述
GR-909 TESTING WITH THE Si321X PROSLIC㈢

阅读下载

获取价格

数据手册

如果您发现信息不准确，欢迎纠错

AN273 数据手册

AN273

3. Tests 1 & 2: Hazardous Potential and Foreign Voltages

These tests employ the same measurement technique; so, they can be implemented as a single test to save time,

assuming that the source of the hazardous potential is always foreign (not generated by the SLIC). The exception

would be if the user implements high-voltage ringing on a short loop, which may result in a ring signal that delivers

>50 V

to the load and/or a dc potential >135 V between ring bursts. The user must be cognizant of this possi-

RMS

bility.

The dc voltage on TIP and RING can be directly read from Direct Registers 80 and 81 while in the OPEN linefeed

state; however, in the presence of a foreign ac voltage, it is very inaccurate. If a large enough sample set is taken

at timed intervals to reconstruct an ac voltage at a minimum of 20 Hz, both the ac and dc voltages are quantified.

If N samples are taken at fixed intervals, the ac and dc voltages on TIP (or RING) may be calculated as follows:

N – 1

---

V_TIP.DC

V_TIP(n)

∑

n = 0

Equation 1.

N – 1

---

V_TIP.AC

(V_TIP(n) – V_TIP.DC)

∑

n = 0

Equation 2.

1.5 V

R_ST

TIP

R_SH*

R_SR

RING

*R_SHinstallation is optional

Figure 1. Si321X OPEN Linefeed State DC Equivalent Circuit

Refer to the demonstration code for an example of implementing ac voltage measurement.

Rev. 0.1

123 4 5 6 7 8

下载PDF

与AN273相关器件

型号	品牌	描述	获取价格	数据表
AN2748	ETC	Genesi Pegasos II Kernel and NFS Facility	获取价格
AN27500A	PANASONIC	Telecom Circuit, 1-Func, 6.20 X 6.20 MM, 0.80 MM HEIGHT, 0.40 MM PITCH, QFN-44	获取价格
AN276	ETC	Sampled-Data 10-Bit CMOS A/D Converter(123.38 k)	获取价格
AN279	SILICON	ESTIMATING PERIOD JITTER FROM PHASE NOISE	获取价格
AN27C128-170V05	INTEL	OTP ROM, 16KX8, 170ns, CMOS, PQCC32	获取价格
AN27C128-200V05	ETC	x8 EPROM	获取价格