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AN273

更新时间： 2022-04-23 23:00:11

品牌	Logo	应用领域
芯科 - SILICON		测试
页数	文件大小	规格书
8页	214K
描述
GR-909 TESTING WITH THE Si321X PROSLIC㈢

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AN273 数据手册

AN273

Table 2. DC Source Resistances

Resistor

BOM Option

Tip-Open

200 kΩ

340 kΩ

160 Ω

Ring-Open

Open

200 kΩ

340 kΩ

200 kΩ

340 kΩ

680 kΩ

1 MΩ

Standard

High Voltage

Standard

160 Ω

200 kΩ

340 kΩ

680 kΩ

1 MΩ

High Voltage

Standard

160 Ω

680 kΩ

1 MΩ

High Voltage

4.2. Condition 2: TIP to RING Fault

If a resistive fault from TIP to RING (R ) is present (see Figure 3), the loop impedance is reduced; thus, the loop

current, I

, increases, which results in a larger drop across R (TIP source impedance) and a more negative

LOOP

voltage at the TIP terminal that can easily be detected.

From the voltages at TIP and RING, the resistive fault, R , may be calculated from the following equation:

R_SH× R_ST( V_RING– V_TIP

)

-------------------------------------------------------------------------------------------------------------

R_TR

R_SH(1.5 + V_TIP) – R_ST( V_RING– V_TIP

)

Equation 3.

Examining Equation 3, there is a single value for V

in which the denominator is zero and R is infinite. This is

TIP

the critical voltage, V

. Solving the denominator for V , the critical voltage is expressed as follows:

TIP_CRIT

TIP

R_ST× V_RING– 1.5 × R_SH

--------------------------------------------------------------------

V_{TIP_CRIT}

_SH+ R_ST

Equation 4.

1.5 V

R_ST

TIP

R_SH

R_TR

V_OC

R_SR

RING

Figure 3. TIP-OPEN Linefeed State with TIP to RING Resistive Fault

Rev. 0.1

1 2 345 6 7 8

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