Datasheet > AM27C010-120DC5

AM27C010-120DC5

更新时间： 2022-11-27 06:31:02

品牌	Logo	应用领域
超微 - AMD		可编程只读存储器电动程控只读存储器
页数	文件大小	规格书
13页	168K
描述
1 Megabit (128 K x 8-Bit) CMOS EPROM

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数据手册

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AM27C010-120DC5 数据手册

TEST CONDITIONS

5.0 V

Table 1. Test Specifications

-45,

-55

All

others

2.7 kΩ

Test Condition

Output Load

Unit

Device

Under

Test

1 TTL gate

Output Load Capacitance, C

(including jig capacitance)

100

6.2 kΩ

Input Rise and Fall Times

Input Pulse Levels

≤ 20

0.0–3.0 0.45–2.4

Input timing measurement

reference levels

1.5

0.8, 2.0

Note:

Diodes are IN3064 or equivalents.

Output timing measurement

reference levels

10205G-7

Figure 3. Test Setup

SWITCHING TEST WAVEFORM

3 V

2.4 V

2.0 V

0.8 V

2.0 V

Test Points

1.5 V

Test Points

1.5 V

0.8 V

0 V

0.45 V

Input

Output

Input

Output

Note: For C = 30 pF.

Note: For C = 100 pF.

10205G-8

KEY TO SWITCHING WAVEFORMS

WAVEFORM

INPUTS

OUTPUTS

Steady

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Does Not Apply

Changing, State Unknown

Center Line is High Impedance State (High Z)

KS000010-PAL

Am27C010

1...6 7 8910 11 12 13

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