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ADUC814ARU PDF预览

ADUC814ARU

更新时间: 2024-02-15 15:27:56
品牌 Logo 应用领域
罗彻斯特 - ROCHESTER 时钟光电二极管外围集成电路
页数 文件大小 规格书
73页 1495K
描述
8-BIT, FLASH, 16.78 MHz, MICROCONTROLLER, PDSO28, 4.40 X 9.70 MM, MO-153AE, TSSOP-28

ADUC814ARU 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active零件包装代码:TSSOP
包装说明:TSSOP,针数:28
Reach Compliance Code:unknown风险等级:5.21
具有ADC:YES地址总线宽度:
位大小:8最大时钟频率:16.78 MHz
DAC 通道:YESDMA 通道:NO
外部数据总线宽度:JESD-30 代码:R-PDSO-G28
JESD-609代码:e0长度:9.7 mm
湿度敏感等级:1I/O 线路数量:16
端子数量:28最高工作温度:125 °C
最低工作温度:-40 °CPWM 通道:NO
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
峰值回流温度(摄氏度):240ROM可编程性:FLASH
座面最大高度:1.2 mm速度:16.78 MHz
最大供电电压:3.3 V最小供电电压:2.7 V
标称供电电压:3 V表面贴装:YES
技术:CMOS温度等级:AUTOMOTIVE
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:30宽度:4.4 mm
uPs/uCs/外围集成电路类型:MICROCONTROLLERBase Number Matches:1

ADUC814ARU 数据手册

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ADuC814  
1Temperature range –40ºC to +125ºC.  
2ADC linearity is guaranteed when operating in nonpipelined mode, i.e., ADC conversion followed sequentially by a read of the ADC result. ADC linearity is also  
guaranteed during normal MicroConverter core operation.  
3ADC LSB size = VREF /212, i.e., for internal VREF = 2.5 V, 1 LSB = 610 µV, and for external VREF = 1 V, 1 LSB = 244 µV.  
4Offset and gain error and offset and gain error match are measured after factory calibration.  
5Based on external ADC system components the user may need to execute a system calibration to remove additional external channel errors  
and achieve these specifications.  
6Measured with coherent sampling system using external 16.77 MHz clock via P3.5 (Pin 22).  
7SNR calculation includes distortion and noise components.  
8Channel-to-channel crosstalk is measured on adjacent channels.  
9The temperature monitor gives a measure of the die temperature directly; air temperature can be inferred from this result.  
10DAC linearity is calculated using a reduced code range of 48 to 4095, 0 V to VREF range; a reduced code range of 48 to 3950, 0 V to VDD range. DAC output load = 10 kΩ  
and 100 pF.  
11DAC differential nonlinearity specified on 0 V to VREF and 0 to VDD ranges.  
12Measured with VREF and CREF pins decoupled with 0.1 µF capacitors to ground. Power-up time for the internal reference is determined by the value of the decoupling  
capacitor chosen for both the VREF and CREF pins.  
13When using an external reference device, the internal band gap reference input can be bypassed by setting the ADCCON1.6 bit. In this mode, the VREF and CREF pins  
need to be shorted together for correct operation.  
14These numbers are not production tested but are guaranteed by design and/or characterization data on production release.  
15Pins configured in I2C compatible mode or SPI mode; pins configured as digital inputs during this test.  
16These typical specifications assume no loading on the XTAL2 pin. Any additional loading on the XTAL2 pin increases the power-on times.  
17Flash/EE memory reliability characteristics apply to both the Flash/EE program memory and the Flash/EE data memory.  
18Endurance is qualified to 100 kcycles as per JEDEC Std. 22, Method A117 and measured at –40ºC, +25°C, and +125°C; typical endurance at +25°C is 700 kcycles.  
19Retention lifetime equivalent at junction temperature (TJ) = 55°C as per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6 eV  
derates with junction temperature as shown in Figure 33 in the Flash/EE memory description section.  
20Power supply current consumption is measured in normal, idle, and power-down modes under the following conditions:  
Normal Mode: Reset and all digital I/O pins = open circuit, core Clk changed via CD bits in PLLCON, core executing internal software loop.  
Idle Mode: Reset and all digital I/O pins = open circuit, core Clk changed via CD bits in PLLCON, PCON.0 = 1, core execution suspended in idle mode.  
Power-Down Mode: Reset and all P1.2–P1.7 pins = 0.4 V; all other digital I/O pins are open circuit, Core Clk changed via CD bits in PLLCON, PCON.1 = 1,  
Core execution suspended in power-down mode, OSC turned on or off via OSC_PD bit (PLLCON.7) in PLLCON SFR.  
21DVDD power supply current increases typically by 3 mA (3 V operation) and 10 mA (5 V operation) during a Flash/EE memory program or erase cycle.  
Rev. A | Page 8 of 72  

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