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AD5533ABCZ-1 PDF预览

AD5533ABCZ-1

更新时间: 2024-01-20 06:24:40
品牌 Logo 应用领域
亚德诺 - ADI 放大器
页数 文件大小 规格书
16页 312K
描述
IC SAMPLE AND HOLD AMPLIFIER, PBGA74, 12 X 12 MM, LFBGA-74, Sample and Hold Circuit

AD5533ABCZ-1 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:LBGA,针数:74
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.35
最长采集时间:16 µs放大器类型:SAMPLE AND HOLD CIRCUIT
最大模拟输入电压:3 V最小模拟输入电压:
JESD-30 代码:S-PBGA-B74JESD-609代码:e1
长度:12 mm湿度敏感等级:3
功能数量:1端子数量:74
最高工作温度:85 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装形状:SQUARE封装形式:GRID ARRAY, LOW PROFILE
峰值回流温度(摄氏度):260认证状态:Not Qualified
采样并保持/跟踪并保持:SAMPLE座面最大高度:1.7 mm
供电电压上限:7 V标称供电电压 (Vsup):5 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:TIN SILVER COPPER端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:12 mm
Base Number Matches:1

AD5533ABCZ-1 数据手册

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AD5533  
TERMINOLOGY  
DC Crosstalk  
VIN to VOUT Nonlinearity  
This is the dc change in the output level of one channel in response  
to a full-scale change in the output of all other channels. It is  
expressed in µV.  
This is a measure of the maximum deviation from a straight line  
passing through the endpoints of the VIN versus VOUT transfer  
function. It is expressed as a percentage of the full-scale span.  
Output Settling Time  
Offset Error  
This is the time taken from when BUSY goes high to when the  
output has settled to 0.018%.  
This is a measure of the output error when VIN = 70 mV. Ideally,  
with VIN = 70 mV:  
Acquisition Time  
This is the time taken for the VIN input to be acquired. It is the  
length of time that BUSY stays low.  
VOUT = Gain × 70 – Gain – 1 ×V  
mV  
(
)
(
(
)
)
OFFS _ IN  
Offset error is a measure of the difference between VOUT (actual)  
and VOUT (ideal). It is expressed in mV and can be positive or  
negative. See Figure 5.  
OFFS_IN Settling Time  
This is the time taken from a 0 V–3 V step change in input volt-  
age on OFFS_IN until the output has settled to within 0.39%.  
Gain Error  
Digital Feedthrough  
This is a measure of the span error of the analog channel. It is the  
deviation in slope of the transfer function. See Figure 5. It is  
calculated as:  
This is a measure of the impulse injected into the analog outputs  
from the digital control inputs when the part is not being written  
to, i.e., CS/SYNC is high. It is specified in nV-s and is measured  
with a worst-case change on the Digital Input Pins, e.g., from all  
0s to all 1s and vice versa.  
Gain Error = Actual Full-Scale Output Ideal Full-Scale  
Output Offset Error  
where:  
Output Noise Spectral Density  
Ideal Full-Scale Output =  
This is a measure of internally generated random noise. Random  
noise is characterized as a spectral density (voltage per root Hertz).  
It is measured by loading all DACs to midscale and measuring  
noise at the output. It is measured in nV/(Hz).  
Ideal Gain × 2.96 – Ideal Gain – 1 ×V  
(
(
)
)
OFFS _IN  
Ideal Gain = 3.52  
Output Temperature Coefficient  
This is a measure of the change in analog output with changes  
in temperature. It is expressed in ppm/°C.  
AC Crosstalk  
This is the area of the glitch that occurs on the output of one channel  
while another channel is acquiring. It is expressed in nV-s.  
DC Power Supply Rejection Ratio  
DC power supply rejection ratio (PSRR) is a measure of the  
change in the analog output for a change in the supply voltage  
(VDD and VSS). It is expressed in dBs. VDD and VSS are varied 5%.  
V
OUT  
GAIN ERROR +  
OFFSET ERROR  
IDEAL  
TRANSFER  
FUNCTION  
ACTUAL  
TRANSFER  
FUNCTION  
OFFSET  
ERROR  
70mV  
2.96  
0V  
3V  
V
IN  
LOWER  
DEAD BAND  
UPPER  
DEAD BAND  
Figure 5. ISHA Transfer Function  
REV. A  
–9–  

AD5533ABCZ-1 替代型号

型号 品牌 替代类型 描述 数据表
AD5533ABC-1REEL ADI

完全替代

IC SAMPLE AND HOLD AMPLIFIER, PBGA74, 12 X 12 MM, LFBGA-74, Sample and Hold Circuit

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