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AD5245BRJ5-R2 PDF预览

AD5245BRJ5-R2

更新时间: 2024-02-15 10:31:57
品牌 Logo 应用领域
亚德诺 - ADI 数字电位计
页数 文件大小 规格书
16页 853K
描述
256-Position I2C Compatible Digital Potentiometer

AD5245BRJ5-R2 数据手册

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AD5245  
TEST CIRCUITS  
Figure 27 to Figure 35 illustrate the test circuits that define the  
test conditions used in the product specification tables.  
5V  
OP279  
V
DUT  
A
V+ = V  
DD  
OUT  
N
V
1LSB = V+/2  
IN  
W
W
V+  
OFFSET  
GND  
B
A
DUT  
B
V
MS  
OFFSET  
BIAS  
Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)  
Figure 32. Test Circuit for Noninverting Gain  
NO CONNECT  
DUT  
A
+15V  
I
W
W
A
V
DUT  
IN  
W
AD8610  
–15V  
V
OUT  
OFFSET  
GND  
B
B
V
MS  
2.5V  
Figure 33. Test Circuit for Gain vs. Frequency  
Figure 28. Test Circuit for Resistor Position Nonlinearity Error  
(Rheostat Operation; R-INL, R-DNL)  
0.1V  
SW  
R
=
SW  
I
DUT  
DUT  
CODE = 0x00  
I
= V /R  
NOMINAL  
DD  
W
W
A
V
W
W
V
MS2  
B
0.1V  
I
SW  
B
V
R
= [V  
– V  
]/I  
MS2  
W
MS1  
W
MS1  
V
TO V  
DD  
SS  
Figure 29. Test Circuit for Wiper Resistance  
Figure 34. Test Circuit for Incremental ON Resistance  
V
A
NC  
V+ = V  
PSRR (dB) = 20 LOG  
10%  
DD  
V  
V  
MS  
DD  
(
)
V
DD  
A
I
V
A
B
%
CM  
V  
V  
DUT  
GND  
DD  
MS  
W
V+  
W
PSS (%/%) =  
%
DD  
B
V
SS  
V
V
MS  
CM  
NC NC = NO CONNECT  
Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSSR)  
Figure 35. Test Circuit for Common-Mode Leakage current  
A
B
DUT  
5V  
W
V
IN  
OP279  
V
OUT  
OFFSET  
GND  
OFFSET  
BIAS  
Figure 31. Test Circuit for Inverting Gain  
Rev. 0 | Page 10 of 16  
 
 
 

AD5245BRJ5-R2 替代型号

型号 品牌 替代类型 描述 数据表
AD5245BRJZ5-RL7 ADI

完全替代

256-Position I2C-Compatible Digital Potentiometer
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完全替代

256-Position I2C-Compatible Digital Potentiometer
AD5245BRJ5-RL7 ADI

完全替代

256-Position I2C Compatible Digital Potentiometer

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