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AD5061YRJZ-1500RL7 PDF预览

AD5061YRJZ-1500RL7

更新时间: 2024-01-14 00:09:09
品牌 Logo 应用领域
罗彻斯特 - ROCHESTER 输入元件光电二极管转换器
页数 文件大小 规格书
21页 1730K
描述
SERIAL INPUT LOADING, 4 us SETTLING TIME, 16-BIT DAC, PDSO8, LEAD FREE, MO-178BA, SOT-23, 8 PIN

AD5061YRJZ-1500RL7 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:SOIC
包装说明:LSSOP,针数:8
Reach Compliance Code:unknown风险等级:5.73
最大模拟输出电压:4.096 V最小模拟输出电压:
转换器类型:D/A CONVERTER输入位码:BINARY
输入格式:SERIALJESD-30 代码:R-PDSO-G8
JESD-609代码:e3长度:2.9 mm
最大线性误差 (EL):0.0061%湿度敏感等级:1
位数:16功能数量:1
端子数量:8最高工作温度:125 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:LSSOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, LOW PROFILE, SHRINK PITCH峰值回流温度(摄氏度):260
认证状态:COMMERCIAL座面最大高度:1.45 mm
标称安定时间 (tstl):4 µs标称供电电压:3 V
表面贴装:YES温度等级:AUTOMOTIVE
端子面层:MATTE TIN端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:40宽度:1.6 mm
Base Number Matches:1

AD5061YRJZ-1500RL7 数据手册

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AD5061  
TERMINOLOGY  
Relative Accuracy  
Total Unadjusted Error (TUE)  
For the DAC, relative accuracy or integral nonlinearity (INꢀ) is  
a measure of the maximum deviation, in ꢀLBs, from a straight  
line passing through the endpoints of the DAC transfer  
function. A typical INꢀ vs. code plot is shown in Figure ±.  
Total unadjusted error is a measure of the output error taking  
all the various errors into account. A typical TUE vs. code plot  
is shown in Figure 5.  
Zero-Code Error Drift  
Differential Nonlinearity (DNL)  
This is a measure of the change in zero-code error with a  
change in temperature. It is expressed in µV/°C.  
Differential nonlinearity is the difference between the measured  
change and the ideal 1 ꢀLB change between any two adjacent codes.  
A specified differential nonlinearity of ±1 LB maximum ensures  
monotonicity. This DAC is guaranteed monotonic by design. A  
typical AD5061 DNꢀ vs. code plot is shown in Figure 6.  
Gain Error Drift  
This is a measure of the change in gain error with changes in  
temperature. It is expressed in (ppm of full-scale range)/°C.  
Digital-to-Analog Glitch Impulse  
Zero-Code Error  
Digital-to-analog glitch impulse is the impulse injected into the  
analog output when the input code in the DAC register changes  
state. It is normally specified as the area of the glitch in nV-s  
and is measured when the digital input code is changed by  
1 ꢀLB at the major carry transition; see Figure 17 and Figure 21.  
The expanded view in Figure 17 shows the glitch generated  
following completion of the calibration routine; Figure 21  
zooms in on this glitch.  
Zero-code error is a measure of the output error when zero  
code (0x0000) is loaded to the DAC register. Ideally, the output  
should be 0 V. The zero-code error is always positive in the  
AD5061 because the output of the DAC cannot go below 0 V.  
This is due to a combination of the offset errors in the DAC and  
output amplifier. Zero-code error is expressed in mV.  
Full-Scale Error  
Full-scale error is a measure of the output error when full-scale  
code (0xFFFF) is loaded to the DAC register. Ideally, the output  
should be VDD − 1 ꢀLB. Full-scale error is expressed in percent  
of full-scale range.  
Digital Feedthrough  
Digital feedthrough is a measure of the impulse injected into  
the analog output of the DAC from the digital inputs of the  
DAC, but is measured when the DAC output is not updated. It  
is specified in nV-s and measured with a full-scale code change  
on the data bus; that is, from all 0s to all 1s, and vice versa.  
Gain Error  
This is a measure of the span error of the DAC. It is the devia-  
tion in slope of the DAC transfer characteristic from ideal  
expressed as a percent of the full-scale range.  
Rev. A | Page 14 of 20  
 

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