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89LV1632RPQK-30 PDF预览

89LV1632RPQK-30

更新时间: 2024-02-03 08:53:12
品牌 Logo 应用领域
麦斯威 - MAXWELL 存储内存集成电路静态存储器
页数 文件大小 规格书
12页 199K
描述
16 Megabit (512K x 32-Bit) Low Voltage MCM SRAM

89LV1632RPQK-30 技术参数

是否Rohs认证: 不符合生命周期:Transferred
零件包装代码:QFP包装说明:QFP,
针数:68Reach Compliance Code:compliant
ECCN代码:3A001.A.2.CHTS代码:8542.32.00.41
风险等级:5.84Is Samacsys:N
最长访问时间:30 nsJESD-30 代码:S-CQFP-G68
长度:37.9476 mm内存密度:16777216 bit
内存集成电路类型:SRAM MODULE内存宽度:32
功能数量:1端子数量:68
字数:524288 words字数代码:512000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:512KX32
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QFP
封装形状:SQUARE封装形式:FLATPACK
并行/串行:PARALLEL认证状态:Not Qualified
座面最大高度:6.1976 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:GULL WING
端子节距:1.27 mm端子位置:QUAD
宽度:37.9476 mmBase Number Matches:1

89LV1632RPQK-30 数据手册

 浏览型号89LV1632RPQK-30的Datasheet PDF文件第4页浏览型号89LV1632RPQK-30的Datasheet PDF文件第5页浏览型号89LV1632RPQK-30的Datasheet PDF文件第6页浏览型号89LV1632RPQK-30的Datasheet PDF文件第8页浏览型号89LV1632RPQK-30的Datasheet PDF文件第9页浏览型号89LV1632RPQK-30的Datasheet PDF文件第10页 
89LV1632  
16 Megabit (512K x 32-Bit)Low Voltage MCM SRAM  
3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or  
V levels.  
OL  
4. At any given temperature and voltage conditions, tHZ (max) is less than tLZ (min) both for a given device and from device to  
device.  
5. Transition is measured +200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.  
6. Device is continuously selected with CS = V .  
IL  
7. Address valid prior to coincident with CS transition low.  
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write  
cycle.  
FIGURE 4. TIMING WAVEFORM OF WRITE CYCLE (1) (OE CLOCK)  
08.18.05 REV 3  
All data sheets are subject to change without notice  
7
©2005 Maxwell Technologies.  
All rights reserved.  

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